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Search Publications

NIST Authors in Bold

Displaying 15826 - 15850 of 73697

Enabling Interactive Measurements from Large Coverage Microscopy

July 1, 2016
Author(s)
Peter Bajcsy, Antoine Vandecreme, Julien M. Amelot, Mary C. Brady, Joe Chalfoun, Michael P. Majurski
Microscopy could be an important tool for characterizing stem cell products if quantitative measurements could be collected over multiple spatial and temporal scales. With the cells changing states over time and being several orders of magnitude smaller

High-Pressure Synthesis of Manganese Oxyhydride with Partial Anion Order

July 1, 2016
Author(s)
Cedric Tassel, Yoshinori Goto, Daichi Watabe, Ya Tang, Honcheng Lu, Yoshinori Kuno, Fumitaka Takeiri, Takafumi Yamamoto, Craig Brown, James Hester, Yoji Kobayashi, Hiroshi Kageyama
We report the high-pressure synthesis of a manganese oxyhydride LaSrMnO 3.3H 0.7. Neutron and X-ray Rietveld analyses showed this compound adopts the K 2NiF 4 structure, with H -positioned exclusively at the equatorial site. This result makes a striking

Nanostructured Surface Phonon Polariton Systems for Mid-Infrared Nanophotonics

July 1, 2016
Author(s)
Alexander Giles, Richard Kasica, Joshua Caldwell
In this article, novel, phonon-based silicon carbide nanopillar antenna arrays are described. Using fabricated SiC structures, sub-diffractional, localized resonances are observed with exceptionally high quality factors (40-305) and corresponding high

Operation Tomodachi -Fire Research Special Issue

July 1, 2016
Author(s)
Samuel L. Manzello, Sayaka Suzuki
NIST’s Engineering Laboratory (EL-NIST) hosted “Operation Tomodachi – Fire Research” on March 16-18, 2015 in Gaithersburg, MD USA. Tomodachi means friendship in Japanese. This workshop was organized by Dr. Samuel L. Manzello of EL-NIST in partnership with

Perfluorinated Alkyl Acids in the Plasma of South African Crocodiles (Crocodylus niloticus)

July 1, 2016
Author(s)
Jessica L. Reiner, John Bowden, Ian Christie, Matthew P. Guillette, Theresa M. Cantu, Russell H. Lowers, Hannes Botha, Wilmien Luus-Powell, Willem J. Smit, Danny Govender, Danie Pienaar, Louis J. Guillette Jr.
Perfluorinated alkyl acids (PFAAs) are environmental contaminants that have been used in many products for over 50 years. Interest and concern has grown since 2000 on the widespread presence of PFAAs, when it was discovered that PFAAs were present in

Recent Activities of the National Commission on Forensic Science

July 1, 2016
Author(s)
John Butler
In February 2013, the U.S. Department of Justice (DOJ) and the National Institute of Standards and Technology (NIST) announced a partnership that included formation of the National Commission on Forensic Science (NCFS) and what is now the Organization of

Stabilizing Lithium and Sodium Fast-Ion Conduction in Solid Polyhedral-Borate Salts at Device-Relevant Temperatures

July 1, 2016
Author(s)
Wan Si NMN Tang, Motoaki Matsuo, Hui Wu, Vitalie Stavila, Atsushi Unemoto, Shin-Ichi Orimo, Terrence J. Udovic
Mechanically milling a variety of lithium and sodium closo-borate compounds enables the room-temperature stabilization of their fast-ion-conducting, high-T-like disordered phases. This represents a viable strategy for better exploiting the impressive

Technical Data Packages (TDPs) from the Smart Manufacturing Systems (SMS) Test Bed

July 1, 2016
Author(s)
Thomas D. Hedberg, Moneer M. Helu, Allison Barnard Feeney
Data is collected from the Manufacturing Lab using the MTConnect standard. That data is aggregated and published internally and externally of NIST via web services. Three channels of data dissemination are available or becoming available from the SMS Test

TRECVid Semantic Indexing of Video: A 6-Year Retrospective

July 1, 2016
Author(s)
George M. Awad, Cees Snoek, Alan Smeaton, Georges Quenot
Semantic indexing, or assigning semantic tags to video samples, is a key component for content-based access to video documents and collections. The Semantic Indexing task has been run at TRECVid from 2010 to 2015 with the support of NIST and the Quaero

Uncertainties in Nanometer-Scale Dimensional Metrology

July 1, 2016
Author(s)
John S. Villarrubia
These are slides used for an oral presentation made at the NIST "Workshop on Quantification of Uncertainties in Material Science." In nanometer-scale dimensional metrology, correction of probing errors, which are caused by the characteristic left/right
Displaying 15826 - 15850 of 73697
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