Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

FINE-TUNING ELECTRICAL FLOW RATE SENSING IN DEFORMABLE CHANNELS

Published

Author(s)

Pengfei Niu, Brian J. Nablo, Kiran Bhadriraju, Darwin Reyes-Hernandez

Abstract

Here we present conclusive proof that when using electrical impedance to measure volumetric flow rate in polydimethylsiloxane (PDMS) microchannels a considerable fraction of the change in impedance, due to change in flow rate, is caused by the variation in bulk solution resistance rather than the disruption of the Helmholtz double layer. The variation in solution resistance is caused, in part, by the channel deformation under pressure. Placing electrodes near the microchannel inlet produces higher sensitivity due to greater channel deformation than those at the outlet. This finding is of paramount importance for the future design of impedance- based flow sensors.
Proceedings Title
Proceedings of Micro Total Analysis Systems 2016
Conference Dates
October 9-13, 2016
Conference Location
Dublin, IE
Conference Title
The 20th International Conference on Miniaturized Systems for Chemistry and Life Sciences

Keywords

Flow sensor, Flow rate, Channel Deformation, Electrical Impedance, PDMS

Citation

Niu, P. , Nablo, B. , Bhadriraju, K. and Reyes-Hernandez, D. (2016), FINE-TUNING ELECTRICAL FLOW RATE SENSING IN DEFORMABLE CHANNELS, Proceedings of Micro Total Analysis Systems 2016, Dublin, IE, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=921608 (Accessed December 13, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 9, 2016, Updated April 7, 2022