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Displaying 68501 - 68525 of 74330

Quantitative Surface Analysis by X-Ray Photoelectron Spectroscopy

January 1, 1978
Author(s)
Cedric Powell
Measurements have been made of the relative intensities of the principal features in X-ray photoelectron spectra of indium, lead, and aluminum oxide and compared with those expected from a simple model for the photoemission process. Systematic effects in
Displaying 68501 - 68525 of 74330
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