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Displaying 62501 - 62525 of 74239

Integrity Tests for High-Tc and conventional critical-current measurement systems

July 28, 1989

Author(s)

Loren F. Goodrich, S L. Bray

Critical-current measurement systems must be extremely sensitive to the small differential voltage that is present across the test specimen as it changes from zero resistance state to the flux-flow resistance state. Consequently, these measurement systems

Comments on a paper by Richardson and De Jonghe

July 17, 1989

Author(s)

George G. Harman

Thermomechanical Detwinning of Superconducting YBa2Cu3O7-x Single Crystals

July 11, 1989

Author(s)

Debra L. Kaiser, Frank W. Gayle, Robert S. Roth, L Swartzendruber

A method for the complete removal of twins from single crystals of superconducting YBa2Cu3O7-x is described. The process depends on ferroelastic behavior found to exist in the phase, and should be generally applicable to the layered perovskite-type phases

An Experimental Investigation and Modeling of the Flow Rate of Refrigerant 22 Through the Short Tube Restrictor (NISTIR 89-4120)

July 1, 1989

Author(s)

D. A. Aaron, Piotr A. Domanski

Refrigerant 22 flow through short tube restrictors was investigated. The analysis pertained to initially subcooled refrigerant flowing through short tubes with 5 L/D 20. The flow conditions studied were those typically found in heat pumps. Flow

Critical-Current Measurements of Nb 3 Sn Superconductors: NBS Contribution to the VAMAS Round Robin

July 1, 1989

Author(s)

Loren F. Goodrich, S L. Bray

Experience with IMDAS in the Automated Manufacturing Research Facility

July 1, 1989

Author(s)

Edward J. Barkmeyer Jr., Jane Lo

The Automated Manufacturing Research Facility (AMRF) is a unique engineering laboratory at the National Institute of Standards and Technology (NIST) Center for Manufacturing Engineering. The facility provides a basic array of discrete metal parts

Interlaboratory Determination of the Calibration Factor for the Measurement of the Interstitial Oxygen Content of Silicon by Infrared Absorption

July 1, 1989

Author(s)

D. Baghdadi, W M. Bullis, C M. Croarkin, L. Yue-Zhen, Robert I. Scace, R. W. Series, P Stallhofer, M. Tan

Near-Field Detection of Buried Dielectric Objects

July 1, 1989

Author(s)

David A. Hill

Optical Waveguide Attenuation Measured by Photothermal Displacement

July 1, 1989

Author(s)

Robert K. Hickernell, J. A. Aust, Donald R. Larson

Reaction chromate-mass spectrometry. 16. Chemical ionization mass spectra of certain N-Trifluoroacylamines

July 1, 1989

Author(s)

Anzor Mikaia, Alexander Ivanov, Vladimir G. Zaikin, George A. Kliger

Advantages and limitations of chemical ionization mass spectrometry for the study of amines as trifluoroacetyl derivatives are presented.

Semiconductor Measurement Technology: A Software Program for Aiding the Analysis of Ellipsometric Measurements, Simple Models

July 1, 1989

Author(s)

Jay F. Marchiando

Semiconductor Measurement Technology: Database for and Statistical Analysis of the Interlaboratory Determination of the Conversion Coefficient for the Measurement of the Interstitial Oxygen Content of Silicon by Infrared Absorption

July 1, 1989

Author(s)

D. Baghdadi, Robert I. Scace, E. J. Walters

Shubnikov-de Haas Measurements on n-Type and p-Type HgTe-CdTe Superlattices

July 1, 1989

Author(s)

David G. Seiler, G. B. Ward, R. J. Justice, R. J. Koestner, M. W. Goodwin, M. A. Kinch, J. R. Meyer

Systematic Errors in Power Measurements Made with a Dual Six Port ANA;

July 1, 1989

Author(s)

C. A. Hoer

The Role of the National Institute of Standards and Technology as it Relates to Product Data Driven Engineering

July 1, 1989

Author(s)

Howard Bloom

The various activities of the National Institute of Standards and Technology (NIST) in the development of a Product Data Exchange Standard (PDES) will be discussed. The NIST activities will be described in terms of the unique position that the agency has

Control Architecture for Cooperative Intelligent Robots

June 30, 1989

Author(s)

James S. Albus

Brain Models & Neural Nets, Robotics & Intelligent Systems

NASREM Robot Control System Standard

June 30, 1989

Author(s)

Ronald Lumia, J Fiala, Albert J. Wavering

Visual Perception Processing in a Hierarchical Control System: Level 1

June 30, 1989

Author(s)

K Chaconas, M Nashman

A CALORIMETRIC AND EQUILIBRIUM INVESTIGATION OF THE HYDROLYSIS OF LACTOSE

June 15, 1989

Author(s)

Robert N. Goldberg, Yadu D. Tewari

Effects of Doping-Density Gradients on Band-Gap Narrowing in Silicon and GaAs Devices

June 15, 1989

Author(s)

J R. Lowney, Herbert S. Bennett

THERMODYNAMICS OF THE HYDROLYSIS OF SUCROSE

June 15, 1989

Author(s)

Robert N. Goldberg, Yadu D. Tewari, J C. Ahluwalia

Measurement and formulation of the thermodynamic properties of refrigerants 134a (1,1,1,2 tetrafluoroethane) and 123 (1,1 dichloro 2,2,2 trifluoroethane)

June 11, 1989

Author(s)

M McLinden, J.S. Gallagher, L Weber, G. Morrison, D Ward, Anthony R. Goodwin, Michael R. Moldover, J W. Schmidt, H B. Chae, Thomas J. Bruno, J F. Ely, Marcia L. Huber

Advances in NIST Dielectric Measurement Capability Using a Mode-Filtered Cylindrical Cavity

June 1, 1989

Author(s)

E. J. Vanzura, W. A. Kissick

Comments on Spherical Near-Field Antenna Measurements

June 1, 1989

Author(s)

Ronald C. Wittmann

Dual Six-Port Reflectometer Systems Using Waveguide in the Frequency Range 18-50 GHz.

June 1, 1989

Author(s)

Claude Weil, F. E. Marler, J R. Major, M. P. Weidman, D. H. Russell

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