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NIST Authors in Bold

Displaying 58426 - 58450 of 74191

Systematic Errors in NIST-7

January 1, 1994
Author(s)
Robert E. Drullinger, W D. Lee, John P. Lowe, F L. Walls, D J. Glaze, Jon H. Shirley

Systems Integration Needs of U.S. Manufacturers

January 1, 1994
Author(s)
Selden Stewart, G Pinholster
In August 1994, the National Institute of Standards and Technology (NIST) held a workshop for industry leaders to address the question of the need for systems integration. These leaders were invited at this time because the Institute was on the verge of

The Design of an Atomic Force Microscope for Metrology

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Atomic force microscope (AFM) is a rapidly evolving technique which has been used in numerous academic studies since its invention eight years ago. AFM manufacturers are now marketing instruments for industrial metrology applications. The National

The Development of a Calibrated Atomic Force Microscope

January 1, 1994
Author(s)
T Mcwaid, J Schneir
Advances in the manufacture of integrated circuits, x-ray optics, magnetic read-write heads, optical data storage media, razor blades, etc. require advances in ultraprecision metrology. Each of these industries is currently investigating the use of Atomic

The Gaseous Electronics Conference radio-frequency reference cell: a defined parallel-plate radio-frequency system for experimental and theoretical studies of plasma processing discharges

January 1, 1994
Author(s)
P J. Hargis, Jr, K E. Greenberg, P A. Miller, J B. Gerardo, J R. Torczynski, M E. Riley, G A. Hebner, J R. Roberts, James K. Olthoff, J R. Whet-stone, R R. Van brunt, M A. Sobolewski, H M. Anderson, M P. Splichal, J L. Mock, P Bletzinger, A Garscadden, R A. Gottscho, G Selwyn, M Dalvie, J E. Heidenreich, J W. Butter-baugh, M L. Brake, M L. Passow, J Pender, A Lujan, M E. Elta, D Graves, H H. Sawin, M J. Kuschner, J T. Verdeyen, R Horwath, T R. Turner

The Geometric Characterization of Rockwell Diamond Indenters

January 1, 1994
Author(s)
Jun-Feng Song, F Rudder, Theodore V. Vorburger, A Hartman, Brian R. Scace, J Smith
By using a stylus instrument, a series of calibration and check standards, and calibration and uncertainty calculation procedures, we have calibrated Rockwell diamond indenters with a traceability to fundamental measurements. The combined measurement
Displaying 58426 - 58450 of 74191
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