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Displaying 56051 - 56075 of 74197

Position Paper for Workshop on Application Integration Architectures

January 1, 1996
Author(s)
Katherine C. Morris
This paper summarizes - the work that is currently being done within ISO 10303 (a.k.a. STEP -- ISO/TC184/SC4) -- the needs for data access and sharing in a manufacturing and engineering environment, and -- the role of the STEP Standard Data Access

Progress Towards Accurate Metrology Using Atomic Force Microscopy

January 1, 1996
Author(s)
T Mcwaid, J Schneir, John S. Villarrubia, Ronald G. Dixson, V W. Tsai
Accurate metrology using atomic force microscopy (AFM) requires accurate control of the tip position, an estimate of the tip geometry, and an understanding of the tip-surface interaction forces. We describe recent progress at NIST towards accurate AFM
Displaying 56051 - 56075 of 74197
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