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Displaying 55951 - 55975 of 74376

Computer-aided manufacturing engineering forum, second technical meeting proceedings:

January 1, 1996

Author(s)

Mike Smith, Swee Leong

Conference Report - Metrology Issues In Terahertz Physics and Technology

January 1, 1996

Author(s)

Raju V. Datla, E Grossman, M K. Hobish

Confidence on the Modified Allan Variance and the Time Variance

January 1, 1996

Author(s)

Marc A. Weiss, F L. Walls, C. A. Greenhall, T Walter

Conformance testing and specification management:

January 1, 1996

Author(s)

James A St Pierre, Kevin G Brady, S L Stewart

Conservation of Vibrational Excitation during Hydrogen Bonding Reactions

January 1, 1996

Author(s)

S M. Arrivo, Edwin J. Heilweil

Counting Radioactivity, ed. by J.C. Harbert, W.C. Eckelman, and R.D. Neumann

January 1, 1996

Author(s)

J C. Harbert, Bert M. Coursey

Critical Evaluation of the Sugar-EPR Dosimetry System

January 1, 1996

Author(s)

P Fattibene, T Duckworth, Marc F. Desrosiers

Cross-Sections for 45 Sc(p,2n) 44 Ti and Related Reactions

January 1, 1996

Author(s)

R Ejnisman, I D. Goldman, P R. Pascholati, M T. Da cruz, R M. Olivera, E B. Norman, I Zlimen, Fred E. Wietfeldt, R M. Larimer, Y D. Chan, K T. Lesko, A Garcia

Data Communications Strategy

January 1, 1996

Author(s)

J Mulvenna, Frederick E. Boland Jr.

Data communications strategy:

January 1, 1996

Author(s)

Jerry Mulvenna, Tim Boland

Data Sharing Implementation Based on the Information Model for Apparel Pattern Making

January 1, 1996

Author(s)

Yung-Tsun T. Lee

A standard neutral file format for facilitating apparel pattern data sharing among dissimilar CAD/CAM systems has been long awaited by the apparel industry. NIST has taken the approach to use the Standard for the Exchange of Product Model Data (STEP)

DBR Laser Diodes for Optically Pumped Cs Frequency Standards

January 1, 1996

Author(s)

Robert E. Drullinger, D A. Jennings, W D. Lee, J M. Lopez-romero

Demonstration of a Phase-Lockable Microwave to Submillimeter-Wave Sweeper

January 1, 1996

Author(s)

S B. Waltman, E R. Brown, K A. Mcintosh

Dependence of level-resolved energy transfer on initial vibrational level in Li 2 A 1 S u + - Ne collisions

January 1, 1996

Author(s)

Y Gao, P S. Gorgone, S Davis, E K. Mccall, B Stewart

Design Criteria for BJT Amplifiers with Low 1/f AM and PM Noise,

January 1, 1996

Author(s)

Eva Ferre-Pikal, F L. Walls, Craig Nelson

Design, integration, and evaluation of form-based handprint and OCR systems:

January 1, 1996

Author(s)

Charles L Wilson, Jon Geist, Michael D Garris, Rama Chellapa

Design, Manufacture, and Calibration of Infrared Radiometric Blackbody Source

January 1, 1996

Author(s)

Thomas R. O'Brian, Steven R. Lorentz, D A. Byrd, F D. Michaud, A L. Bender, A L. Luettgen, R F. Holland

Designations of ds 2 p Energy Levels in Neutral Zirconium, Hafnium, and Rutherfordium (Z=104)

January 1, 1996

Author(s)

William C. Martin, J Sugar

Detailed Theoretical Photoelectron Angular Distributions for LiF(100)

January 1, 1996

Author(s)

Eric L. Shirley, F J. Himpsel, L J. Terminello, J E. Klepeis

Determination of the Nuclear Quadrupole Coupling Constants of NaOH, KOH, RbOH, and CsOH and Electric Dipole Moment of NaOH

January 1, 1996

Author(s)

Y Kawashima, R D. Suenram, E Hirota

Developing Quality System Documentation Based on ANSI/NSCL Z540-1-1994 -- The Optical Technology Division's Efforts

January 1, 1996

Author(s)

S S. Bruce, Thomas C. Larason

Developing quality system documentation based on ANSINCSL Z540-1-1994 -- the optical technology division's effort:

January 1, 1996

Author(s)

Sally S Bruce, Thomas C Larason

Development of a test method for leaching of lead from lead-based paints through encapsulates:

January 1, 1996

Author(s)

Tinh Nguyen, Mary E McKnight, Eric Byrd

Development of a test method for measuring water-stripping resistance of asphaltsiliceous aggregate mixtures:

January 1, 1996

Author(s)

Tinh Nguyen, Eric Byrd, Dale Bentz, Jim Seiler

Development of Virtual Machine Tools

January 1, 1996

Author(s)

M A. Donmez

This paper describes a new project that is part of a program initiated by the Manufacturing Engineering Laboratory of the National Institute of Standards and Technology (NIST) to develop infrastructural tools that facilitate information-based manufacturing

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