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Displaying 55126 - 55150 of 74337

The Scanning Electron Microscope

January 1, 1997
Author(s)
Michael T. Postek
The scanning electron microscope (SEM) is an important research and production tool extensively used in many phases of industry throughout the world. The popularity of the instrument results from the need to inspect and obtain information about samples

Time Domain Waveforms of a Line-Focus Transducer Probing Anisotropic Solids

January 1, 1997
Author(s)
Nelson N. Hsu, Gerald V. Blessing, D Xiang
We have developed a large lensless line-focus wideband ultrasonic transducer which can be used to probe solid materials through water. With conventional ultrasonic equipment the transducer can perform time and polarization resolved surface and body wave

Tip and Surface Reconstruction in Scanned Probe Microscopy

January 1, 1997
Author(s)
John S. Villarrubia
The non-vanishing size of tips in scanned probe microscopes (e.g., atomic force microscope or scanning tunneling microscope) results in imaging errors. Correction of these errors requires estimation of the tip shape (tip reconstruction) followed by
Displaying 55126 - 55150 of 74337
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