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Displaying 551 - 575 of 3124

Using Truncated Data Sets in Spherical Scanning Antenna Measurements

February 8, 2012
Author(s)
Ronald C. Wittmann, Carl F. Stubenrauch, Michael H. Francis
We discuss the mitigation of truncation errors in spherical scanning measurements. The main emphasis is the spherical harmonic representation of probe transmitting and receiving functions; however, our method is applicable to near-field measurement of

A Novel Method for Determining the Lower Bound of Antenna Efficiency

December 31, 2011
Author(s)
Jason B. Coder, John M. Ladbury, Mark Golkowski
Determining the absolute antenna efficiency has been a difficult task since the inception of the antenna itself. While there are methods that can measure an antenna’s efficiency, most are complicated and prone to high uncertainties. A new method is

A Large-Signal Model of Ferroelectric Thin-Film Transmission Lines"

December 1, 2011
Author(s)
Eduard Rocas, Juan C. Collado Gomez, Jordi Mateu, Nate Orloff, James Booth, Juan M. O'C allaghan
"This work evaluates the microwave nonlinear properties and tuning at RF frequencies of ferroelectric Ba0.3Sr0.7TiO3 thin-films by on-wafer measurements of the second and third-order harmonics and intermodulation products of several coplanar transmission

Verification of Noise-Parameter Measurements and Uncertainties

November 1, 2011
Author(s)
James P. Randa, Dazhen Gu, Dave K. Walker
We propose and implement verification methods for measurements of noise parameters of amplifiers and transistors. Because the verification rests on the comparison of different measurement results, it also serves as a test of the uncertainties. The

500 GHz - 750 GHz Rectangular-Waveguide Vector-Network-Analyzer Calibrations

October 31, 2011
Author(s)
Dylan F. Williams
We develop an uncertainty analysis that captures the dominant sources of measurement error in state-of-the-art rectangular-waveguide vector-network-analyzer measurements over the frequency range 500 GHz – 750 GHz. We use the analysis to assess thru-reflect

On-Chip Security Using Electromagnetic Analysis

October 27, 2011
Author(s)
James Schaffner, Dylan Williams
In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic

Effective Material Property Extraction Of a Metamaterial by Taking Boundary Effects into Account At TE/TM Polarized Incidence

September 22, 2011
Author(s)
Sung Kim, Christopher L. Holloway, James R. Baker-Jarvis, Edward Kuester, Kendra L. Kimberly
In this paper, we present the extraction for effective material parameters for a metamaterial from TE or TM waveguide measurements with generalized sheet transition conditions (GSTCs) used to provide electric and magnetic surface susceptibilities that

Terahertz metrology and instrumentation

August 29, 2011
Author(s)
Erich N. Grossman, Zoya Popovic
This paper gives an overview of measurement techniques used in the THz region of the electromagnetic spectrum, from about 100 GHz to several THz. Currently available components necessary for THz metrology, such as sources, detectors and passives, are
Displaying 551 - 575 of 3124
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