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On-Chip Security Using Electromagnetic Analysis

Published

Author(s)

James Schaffner, Dylan Williams

Abstract

In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic monitoring than from power analysis. This is a first step to developing systematic ways of assessing the vulnerabilities of security microcontrollers to these attacks and developing and assessing the effectiveness of mitigation strategies for these attacks.
Citation
Grant/Contract Reports (NISTGCR) - 687-12-71
Report Number
687-12-71

Keywords

RFID, seturity, electro-magnetic analysis, integrated circuit

Citation

Schaffner, J. and Williams, D. (2011), On-Chip Security Using Electromagnetic Analysis, Grant/Contract Reports (NISTGCR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed October 5, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 26, 2011, Updated October 12, 2021