Schaffner, J.
and Williams, D.
(2011),
On-Chip Security Using Electromagnetic Analysis, Grant/Contract Reports (NISTGCR), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed October 17, 2025)
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On-Chip Security Using Electromagnetic Analysis
Published
Author(s)
James Schaffner,
Abstract
In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic monitoring than from power analysis. This is a first step to developing systematic ways of assessing the vulnerabilities of security microcontrollers to these attacks and developing and assessing the effectiveness of mitigation strategies for these attacks.Citation
Grant/Contract Reports (NISTGCR) - 687-12-71
Report Number
687-12-71
NIST Pub Series
Pub Type
NIST Pubs
Keywords
RFID, seturity, electro-magnetic analysis, integrated circuit
Citation
Issues
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Created October 26, 2011, Updated October 12, 2021