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On-Chip Security Using Electromagnetic Analysis



James Schaffner, Dylan Williams


In this report we describe a test bed designed to assess the vulnerabilities of security microcontrollers to electromagnetic monitoring, and use the test bed to show that it is indeed possible to gather more local information from electromagnetic monitoring than from power analysis. This is a first step to developing systematic ways of assessing the vulnerabilities of security microcontrollers to these attacks and developing and assessing the effectiveness of mitigation strategies for these attacks.
Grant/Contract Reports (NISTGCR) - 687-12-71
Report Number


RFID, seturity, electro-magnetic analysis, integrated circuit


Schaffner, J. and Williams, D. (2011), On-Chip Security Using Electromagnetic Analysis, Grant/Contract Reports (NISTGCR), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 24, 2024)


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Created October 26, 2011, Updated October 12, 2021