U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 54601 - 54625 of 74483

Coercivity of Ultrathin Films with In-plane Magnetization

April 15, 1997
Author(s)
R Hyman, Mark D. Stiles, L Tang, A Zangwill
We report numerical and analytic results for a model of coercivity and magnetization reversal in an array of square monolayer-height magnetic islands on a monolayer of magnetic material with in-plane magnetization. Reversal nucleates at step edges where

Error Analysis of a Hexapod Machine Tool

April 3, 1997
Author(s)
Johannes A. Soons
This paper describes the measurement and analysis of the quasi-static errors of a prototype hexapod milling machine at the National Institute of Standards and Technology (NIST). Emphasis is placed on a) the identification and definition of the parametric

Structure, magnetism, and tunable microwave properties of pulsed laser deposition grown barium ferrite/barium strontium titanate bilayer films

April 2, 1997
Author(s)
Ranko R. Heindl, H. Srikanth, T. Weller, S. Witanachchi, P. Mukherjee, A. S. Tatarenko, G. Srinivasan
Ferrite/ferroelectric films are of interest as they afford dual tunability of the permeability and permittivity using magnetic and electric fields. We have grown bilayered thin films of ferrimagnetic BaFe12O19 (BaM) and ferroelectric Ba0.5Sr0.5TiO3 (BST)

A Context for Interoperability Standards for the Footwear Industry

April 1, 1997
Author(s)
Howard T. Moncarz
Emerging technologies for footwear manufacturing in combination with advanced information infrastructure and virtual enterprise technologies have the potential to revolutionize the footwear industry. The developments could create a large market for custom

AC Josephson Voltage Standard: Progress Report

April 1, 1997
Author(s)
Clark A. Hamilton, Charles J. Burroughs, Samuel Benz, Joseph R. Kinard Jr.
Progress toward a Josephson voltage standard for fast dc measurements and accurate ac waveform systhesis is described. A superconductor-normal-superconductor (SNS) junction process is used to make 5 mA critical current arrays with up to 32 768 junctions

Glass and Dimensional Metrology

April 1, 1997
Author(s)
Theodore D. Doiron
Ordinary glass, even good optical quality glass, will shrink up to 20 micrometers/meter over the first few years after its manufacture. Gages made of glass are therefore not suitable as high accuracy artifacts unless they are calibrated often. Better
Displaying 54601 - 54625 of 74483
Was this page helpful?