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Displaying 53626 - 53650 of 74517

NIST Microform Calibration - How It Benefits U.S. Industry

January 1, 1998
Author(s)
Jun-Feng Song, Theodore V. Vorburger
In microform metrology, complex 3-D surface features in the micrometer range must be quantified for their space and size including dimensions, curves, angles, profile deviations, and alignment errors, as well as surface roughness with measure uncertainties

NIST Physics Laboratory WWW page

January 1, 1998
Author(s)
J S. Coursey, Robert A. Dragoset, Peter J. Mohr, Karen J. Olsen, Edward B. Saloman, G G. Wiersma, M A. Zucker

NIST Standard Reference Materials Catalog 1998-99

January 1, 1998
Author(s)
N M. Trahey
This catalog provides technical and general ordering information for the Standard Reference Materials [SRMs] and Reference Materials [RMs] currently available from the NIST SRM Program. The materials are arranged according to technical category and
Displaying 53626 - 53650 of 74517
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