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Displaying 53301 - 53325 of 73896

Critical Issues in Wire-Bonded Chip Interconnections to the Year 2001

December 31, 1997

Author(s)

George G. Harman

DC SQUID Series Arrays with Intracoil Damping to Reduce Resonance Distortions

December 31, 1997

Author(s)

Martin Huber, A. M. Corey, K. L. Lumpkins, F. N. Nafe, J. Rantschler, Gene C. Hilton, John M. Martinis, A. H. Steinbach

We report on low-noise DC SQUID series arrays incorporating intracoil damping, which show smooth DC characteristics. The voltage-flux characteristics of these devices are reproducible upon repeated cooling and do not require multiple heating/cooling cycles

Design and Fabrication of Micromachined Passive Microwave Filtering Elements in CMOS Technology

December 31, 1997

Author(s)

V. Milanovic, Michael Gaitan, E. D. Bowen, N. H. Tea, Mona E. Zaghloul

Development of a High Flux Conduction Calibration Apparatus

December 31, 1997

Author(s)

William L. Grosshandler, David L. Blackburn

Electrical Linewidth Test Structures Fabricated in Mono-Crystalline Films for Reference Material Applications

December 31, 1997

Author(s)

Michael W. Cresswell, J. J. Sniegowski, Rathindra Ghoshtagore, Richard A. Allen, William F. Guthrie, Loren W. Linholm

High Dopant and Carrier Concentration Effects in Gallium Aluminum Arsenide: Band Structure, Effective Carrier Concentrations, and Mobilities

December 31, 1997

Author(s)

Herbert S. Bennett

Implementation of Thermoelectric Microwave Power Sensors in CMOS Technology

December 31, 1997

Author(s)

V. Milanovic, Michael Gaitan, E. D. Bowen, N. H. Tea, Mona E. Zaghloul

Inverstigation of the Intrinsic SiO 2 Area Dependence Using TDDB Testing

December 31, 1997

Author(s)

J. Prendergast, John S. Suehle

Investigation of the Influence of Ramped Voltage Stress on Intrinsic tbd of MOS Gate Oxides

December 31, 1997

Author(s)

A. Martin, P. O'Sullivan, A. Mathewson, John S. Suehle, P Chaparala

Issues in Validating Package Thermal Models for Natural Convection Cooled Electronic Systems

December 31, 1997

Author(s)

V. H. Adams, David L. Blackburn, Yogendra K. Joshi, David W. Berning

Models for Interpreting Measurements Scanning Capacitance Microscope Measurements

December 31, 1997

Author(s)

Jay F. Marchiando, J R. Lowney, Joseph Kopanski

Optical Properties of Mercury Cadmium Telluride

December 31, 1997

Author(s)

Paul M. Amirtharaj, John H. Burnett

Optimization of the Electrical Properties of Low-Dose SIMOX Wafers

December 31, 1997

Author(s)

P. J. McMarr, B. J. Mrstik, M. E. Twigg, H. L. Hughes, M. J. Anc, Peter Roitman, G. A. Garcia

Package Geometry Considerations in Thermal Compact Modeling Strategies

December 31, 1997

Author(s)

V. H. Adams, Yogendra K. Joshi, David L. Blackburn

Practical Metrology Aspects of Scanning Capacitance Microscopy for Silicon 2-D Dopant Profiling, Condensed version

December 31, 1997

Author(s)

Joseph Kopanski, Jay F. Marchiando, R. Alvis

Reference-Length Shortening by Kelvin Voltage in Linewidth Test Structures Replicated in Mono-Crystalline Silicon Films

December 31, 1997

Author(s)

W. F. Lee, William F. Guthrie, Michael W. Cresswell, Richard A. Allen, J. J. Sniegowski, Loren W. Linholm

Scanning Capacitance Microscopy Applied to 2D Dopant Profiling of Semiconductors

December 31, 1997

Author(s)

Joseph Kopanski, Jay F. Marchiando, J R. Lowney

Scanning Capacitance Microscopy Measurement of 2-D Dopant Profiles across Junctions

December 31, 1997

Author(s)

Joseph Kopanski, Jay F. Marchiando, David W. Berning

Simplified Fire Growth Calculations

December 31, 1997

Author(s)

E K. Budnick, D D. Evans, H Nelson

This work is one chapter of the 19th NFPA Fire Protection Handbook directed at giving the user simplified methods to estimate quantities used in fire protection engineering. The areas included are: ignitability of solids, energy release rate, flame heights