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Displaying 53276 - 53300 of 74189

New Ultraviolet Radiometry Beamline at the Synchrotron Ultraviolet Radiation Facility at NIST

January 1, 1998
Author(s)
Ping-Shine Shaw, Keith R. Lykke, Thomas R. O'Brian, Uwe Arp, H H. White, Thomas B. Lucatorto, J L. Dehmer, Albert C. Parr, R Gupta
We have constructed a new (UV) radiometry facility at the Synchrotron Ultraviolet Radiation Facility [SURF II] at the National Institute of Standards and Technology (NIST). The facility combines a high-throughput normal-incidence monochromator with an

NGIS SIM Specification

January 1, 1998
Author(s)
William G. Rippey, John L. Michaloski, Martin Herman, Sandor S. Szabo, W Dewys, N Frampton

NGIS SIM Specification:

January 1, 1998
Author(s)
William G Rippey, John L Michaloski, Martin Herman, Sandor Szabo, William DeWys Frampton, Nathaniel, Herbert Lau, Eun Soo Lee, John Rose

NIST Atomic Spectra Database

January 1, 1998
Author(s)
G R. Dalton, Robert A. Dragoset, Jeffrey R. Fuhr, Daniel E. Kelleher, Svetlana A. Kotochigova, William C. Martin, Peter Mohr, Arlene Musgrove, Karen J. Olsen, Larissa Podobedova, Edward B. Saloman, J Sugar, Wolfgang L. Wiese, C S. Grant, G Eichhorn, Richard L. Kelly, T Shirai, V I. Azarov, Alexander Kramida, A N. Ryabtsev, J Blaise, J F. Wyart

NIST Calibration Services Users Guide 1998 Edition

January 1, 1998
Author(s)
J L. Marshall
This publication lists all the calibration, special test, and measurement assurance program services available from the National Institute of Standards and Technology (NIST) to characterize instruments and devices that are metrologically suitable as

NIST Manufacturing Process Planning and CAME Forum Workshop

January 1, 1998
Author(s)
Mike Smith, Swee K. Leong, William Regli
This workshop brought together participants from the earlier workshops held as part of the Process Planning Workshop Series and previous technical meetings of the CAME Forum. The two-day workshop was designed to promote interaction and sharing among

NIST Measurement Services: Radiance Temperature Calibrations

January 1, 1998
Author(s)
Charles E. Gibson, Benjamin K. Tsai, Albert C. Parr
This document describes the realization and dissemination of the International Temperature Scale of 1990 (ITS-90) above 700 [degrees] C at the National Institute of Standards and Technology (NIST). By using the fundamental principles of blackbody physics

NIST Microform Calibration - How It Benefits U.S. Industry

January 1, 1998
Author(s)
Jun-Feng Song, Theodore V. Vorburger
In microform metrology, complex 3-D surface features in the micrometer range must be quantified for their space and size including dimensions, curves, angles, profile deviations, and alignment errors, as well as surface roughness with measure uncertainties
Displaying 53276 - 53300 of 74189
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