Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 52476 - 52500 of 73893

Contact Damage Accumulation in Ti3SiC2

February 3, 1998
Author(s)
I M. Low, S K. Lee, Brian R. Lawn, M W. Barsoum
The evolution of deformation-microfracture damage below Hertzian contacts in a coarse grain Ti3SiC2 is studied. The Hertzian indentation stress-strain response deviates strongly from linearity beyond a well-defined maximum, with pronounced strain-softening

Automated SIMS for Determining Isotopic Distributions in Particle Polutations

February 1, 1998
Author(s)
David S. Simons, John G. Gillen, Cynthia J. Zeissler, R H. Fleming, P J. McNitt
A System has been developed to make rapid automated measurements of isotopic ratios from many individual micrometer-sized particles dispersed on a substrate. High particle throughput is achieved by using a commercial secondary ion microscope to collect

Char Enhancing Approaches to Flame Retarding Polymers

February 1, 1998
Author(s)
Jeffrey W. Gilman, Takashi Kashiwagi, Richard H. Harris Jr., S M. Lomakin, J D. Lichtenhan, A. Bolf, P. Jones
Additives that increase the amount of charcoal-like residue or carbonaceous char that forms during polymer combustion are very effective fire retardants (FR). Our research efforts focus on reducing polymer flammability by promoting char formation. Our

Comparison of Time Base Nonlinearity Measurements Techniques

February 1, 1998
Author(s)
Gerard N. Stenbakken, J. P. Deyst
Distortions in the timebases of equivalent-time oscilloscopes and digitizers cause distortions of waveforms sampled by them. This paper reports on a comparison of two methods of characterizing timebase distortion, using pure sine-wave inputs of known

Defect Induced Lowering of Activation Energies at Step Bands in Co/Cu(100)

February 1, 1998
Author(s)
S T. Coyle, M Scheinfein, J L. Blue
Complex topological features such as rectangular voids and step inclusions that were seen in secondary electron micrographs of Co films grown on Cu(100) at room temperature were reproduced in Monte Carlo simulations in the presence of step bands. Lowered
Displaying 52476 - 52500 of 73893
Was this page helpful?