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Displaying 51501 - 51525 of 73892

Micromachined Silicon Torsional Resonator for Magnetic Anisotropy Measurement

November 1, 1998
Author(s)
J. Morillo, Q. Su, B. Panchapakesan, Matthias Wuttig, Donald B. Novotny
A novel method for measuring the out-of-plane magnetic anisotropy of thin films has been developed using the existing techniques of silicon micromachining. The torsion pendulum which is commonly used to measure the perpendicular magnetic anisotropy energy

Morphology of Polyethylene-Carbon Black Composites

November 1, 1998
Author(s)
G Beaucage, Daniel A. Fischer, Gabrielle G. Long, S Rane, D W. Schaefer
Carbon black is a common polymer additive that is used for reforcement and for its ability to enhance physical properties such as conductivity. This paper pertains to a small-angle x-ray scattering [SAXS] study of a conductive grade of carbon black and

NIST Atomic Spectra Database (1998)

November 1, 1998
Author(s)
G R. Dalton, Robert A. Dragoset, Jeffrey R. Fuhr, Daniel E. Kelleher, Svetlana A. Kotochigova, William C. Martin, Peter Mohr, Arlene Musgrove, Karen J. Olsen, Larissa Podobedova, Edward B. Saloman, J Sugar, Wolfgang L. Wiese, C S. Grant, G Eichhorn, Richard L. Kelly, T Shirai, V I. Azarov, Alexander Kramida, A N. Ryabtsev, J Blaise, J-F Wyart

Performance of a Commerical Hot Water Boiler

November 1, 1998
Author(s)
Cheol D. Park, S T. Liu
In responding to ASHRAE SPC 155P's interest and to provide additional evidence on the envisioned linear relationship between output and input of a boiler under part load conditions, the National Institute of Standards and Technology undertook to conduct a

Properties of Process Gases Determined Accurately With Acoustic Techniques

November 1, 1998
Author(s)
John J. Hurly
Our laboratory has developed a highly precise, automated apparatus for measuring sound speeds, viscosity, and thermal conductivity in hazardous and/or corrosive process gases throughout the temperature and pressure ranges of interest to the semiconductor

Report of the 83rd National Conference on Weights and Measures

November 1, 1998
Author(s)
G M. Ugiansky, J L. Land
The 83rd Annual Meeting of the National Conference on Weights and Measures (NCWM) was held July 12 through July 16, 1998, at the Hilton Hotel in Portland, Oregon. The theme of the meeting was Working Together for Equity.Reports by the Standing and Annual

Shear Induced Restructuring of Dense Colloidal Silica Gels

November 1, 1998
Author(s)
Howard J. Hanley, Chris D. Muzny, B D. Butler, G C. Straty, J Barlett, E. Drabarek
The viscometric properties and structure of concentrated sheared colloidal gels, formed at a pH = 8 from a commercial aqueous sol of 7 nm diameter silica particles, were investigated.

Support Vector Machines Applied to Face Recognition

November 1, 1998
Author(s)
P J. Phillips
Face recognition is a K class problem, where K is the number of known individuals; and support vector machines (SVMs) are a binary classification method. By reformulating the face recognition problem and re-interpreting the output of the SVM classifier, we

Synthesis, Characterization, and Crystal Structure of Dicalcium Glutarylbisphosphonate Dihydrate - Covalently Pillared Layer Structure with the Potential for Epitaxial Growth on Hydroxyapatite.

November 1, 1998
Author(s)
M Mathew, Bruce O. Fowler, E Breuer, G Golomb, I S. Alferiev, Naomi Eidelman
A new bisacylphosphonate, glutarylbisphosphonate (GlBP) was synthesized. Sodium and calcium salts of the GlBP, disodium dihydrogenglutarylbisphosphonate, NaHO 3P-C(O)-(CH 2) 3C(O)-PO 3Hna and dicalcium glutarylbisphosphonate dihydrate, Ca 2[O 3P-C(O)-(CH 2

The High-Resolution Raman Spectrum of the N 4 Band of Diborane

November 1, 1998
Author(s)
J L. Domenech, D Bermejo, J.- M. Flaud, Walter J. Lafferty
The high resolution Raman spectra of the Ņ 4 bands of 11B 2H 6 and 11B 10BH 6 have been recorded and analyzed. The recordings have been made using a high resolution spectrometer based on the inverse Raman effect, with an instrumental resolution of 0.007 cm

The OOF Manual: Version 1.0

November 1, 1998
Author(s)
W C. Carter, Stephen A. Langer, Lin-Sien H. Lum
OOF and PPM200F are programs developed at NIST to investigate the properties of microstructures. The user starts with an image of a real or simulated microstructure, assigns material properties to the features in the image, and performs virtual experiments
Displaying 51501 - 51525 of 73892
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