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Displaying 50901 - 50925 of 73878

Measurement Uncertainty and Noise in Nanometrology

January 1, 1999
Author(s)
James E. Potzick
The measurement of feature sizes on integrated circuit photomasks and wafers is an economically important and technically challenging application of nanometrology. The displacement measuring laser heterodyne interferometer is a popular tool in such

Measurement Uncertainty and Uncorrected Bias

January 1, 1999
Author(s)
Steven D. Phillips, K Eberhardt, William T. Estler
This paper discusses the distinction between measurement uncertainty, measurement errors and their role in the calibration process. The issue of including uncorrected bias is addressed and a method to extend the current ISO Guide to the Expression of

Measuring the Geometric Errors of a Hexapod Machine Tool

January 1, 1999
Author(s)
Johannes A. Soons
This paper describes procedures to measure the geometric errors of parallel kinematic machines with a Gough configuration. The procedures are applied to estimate and compensate the errors of a prototype hexapod milling machine.

Metallurgy: 1998 Programs and Accomplishments

January 1, 1999
Author(s)
C A. Handwerker, Robert J. Schaefer
The activities of the NIST Metallurgy Division during FY 1998 are described. The Division's activities are organized into four major programs and two smaller ones, and highlights from each program are presented. The report includes descriptions of the

Microstructural Characterization for Polymer Composites

January 1, 1999
Author(s)
Richard~undefined~undefined~undefined~undefined~undefined Parnas, Donald L. Hunston, Joy Dunkers, Gale A. Holmes
Characterization of composite microstructure is a crucial area since such features plays a major role in processability, performance, damage tolerance, and service life. Moreover, as the reinforcement geometries available are becoming more complex, the

Microwave Network Analyzers - A Discussion of Verification Methods

January 1, 1999
Author(s)
Ronald A. Ginley
Verification of Vector Network Analyzers (VNAs) is very important to the measurement process as well as to establish confidence in the uncertainty of the system. This paper presents a basic discussion about VNA verification including what verification is

Modified Field Studies for CSCW Systems

January 1, 1999
Author(s)
Michelle P. Steves, Jean C. Scholtz
We, at the National Institute of Standards and Technology (NIST), are in the process of instituting and assessing collaboration technologies for manufacturing applications. This position paper for the Computer Supported Cooperative Work (CSCW) Evaluation

Molecular Level Design of Fire Retardants and Suppressants (NISTIR 6275)

January 1, 1999
Author(s)
Marc R. Nyden
The various methods that comprise the field of molecular modeling are reviewed in the context of their potential for application to the molecular level design of new fire retardants and suppressants. The capabilities of these techniques are demonstrated by
Displaying 50901 - 50925 of 73878
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