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Displaying 50876 - 50900 of 74196

Electronic Structure and Spectra of Oxovanadium Silicate

January 11, 1999
Author(s)
Morris Krauss
The electronic structure and spectroscopy of the oxovanadium catalytic center on a silica surface is modeled with the molecule OV(OSIH 3)3. Excited electronic states are examined at optimized geometries for the ground singlet and triplet states. For both

Next Generation Fire Suppression Technology Program (NGP)

January 7, 1999
Author(s)
Richard G. Gann
The Next-Generation Fire Suppression Program (NGP), now in its second year, has as its goal the development by 2004 of alternative firefighting technologies to Halon 1301 that can be economically implemented in aircraft, ships, land combat vehicles, and

Standards for the rapid prototyping industry

January 4, 1999
Author(s)
Kevin K. Jurrens
This paper proposes that development of formalized standards for the rapid prototyping (RP) industry will help enable the continued growth and further advancement of RP technologies. Appropriate standards can provide common methods for measuring the

1998 Activities, Accomplishments, and Recognitions

January 1, 1999
Author(s)
Noel J. Raufaste Jr
The Natioinal Institute of Standards and Technology's Building and Fire Research Laboratory (NIST/BFRL), one of NIST's measurements and standards laboratories, provides the measurement technologies, performance prediction methods, and technical advances

A Comparison of Different Micromagnetic Solvers

January 1, 1999
Author(s)
L L. Diaz, J G. Eicke, Edward Della Torre
Micromagnetic equations have characteristics that differ from electromagnetic field problems. Under certain conditions, EM solvers are not very efficient. This paper compares the speed of several micromagnetic solvers on two different problems.

A Constrained Monte Carlo Simulation Method for the Calculation of CMM Measurement Uncertainty

January 1, 1999
Author(s)
Steven D. Phillips, Bruce R. Borchardt, Daniel S. Sawyer, William T. Estler, K Eberhardt, M Levenson, Marjorie A. McClain, Ted Hopp
We describe a Monte Carlo simulation technique where known information about a metrology system is employed as a constraint to distinguish the errors associated with the instrument under consideration from the set of all possible instrument errors. The
Displaying 50876 - 50900 of 74196
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