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Displaying 49576 - 49600 of 74324

Ultrasonic Research in the NIST Manufacturing Engineering Laboratory

January 1, 2000
Author(s)
Gerald V. Blessing, Steven E. Fick, Nelson N. Hsu, John A. Slotwinski
The Ultrasonics Standards Group in the Manufacturing Engineering Laboratory of the National Institute of Standards and Technology ( NIST) performs research, develops standards, and offers calibration services in support of United States industry. In this

Using Failure History to Improve Reliability in Information Technology

January 1, 2000
Author(s)
D Wallace
Achieving 100 % software reliability may seem an unreasonable goal. Software developers and consumers of many software products are largely unsure about the reliability of their product or purchase. Today, many opportunities exist for some assurance of

Video Quality Experts Group: Current Results and Future Directions

January 1, 2000
Author(s)
A. M. Rohaly, P. Corriveau, John M. Libert, A. Webster, V. Baroncini, J. Beerends, J. L. Blin, L. Contin, T. Hamada, Diane Harrison, A. Hekstra, Jack Lubin, Y. Nishida, R. Ishihara, J Pearson, A. F. Pessoa, N. Pickford, A. Schertz, M. Visca, A. B. Watson, S. Winkler
Subjective assessment methods have been used reliably for many years to evaluate video quality. They continue to provide the most reliable assessments compared to objective methods. Some issues that arise with subjective assessment include the cost of

Video Quality Experts Group: The Quest for Valid Objective Methods

January 1, 2000
Author(s)
P. Corriveau, A. Webster, A. M. Rohaly, John M. Libert
Subjective assessment methods have been used reliably for many years to evaluate video quality. They continue to provide the most reliable assessments compared to objective methods. Some issues that arise with subjective assessment include the cost of

X-ray Scattering and Fluorescence From Atoms and Molecules

January 1, 2000
Author(s)
S H. Southworth, L Young, E P. Kanter, Thomas W. LeBrun
Fundamental understanding of x-ray interactions with atoms and molecules provides a basis for applying x-ray methods to complex materials, such as structural determinations by x-ray diffraction and extended x-ray absorption fine structure. Compton

Coplanar Transmission Lines with Meandering Center Conductors in Y-Ba-Cu-O/Au Bilayers

December 31, 1999
Author(s)
C Weber, Ronald H. Ono, James Booth, Leila R. Vale, Samuel Benz, A. M. Klushin, H. Kohlstedt, C. Buchal, R. Semerad
We have investigated both conventional and meandering coplanar microwave transmission lines patterned in Y-Ba-Cu-O/Au bilayers on yttria-stablized zirconia and sapphire substrates. Within the meandering waveguides, the gentre conductor was deformed from a
Displaying 49576 - 49600 of 74324
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