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Displaying 49401 - 49425 of 143780

Tunable laser spectroscopy referenced with dual frequency combs

June 15, 2010
Author(s)
Fabrizio R. Giorgetta, Ian R. Coddington, Esther Baumann, William C. Swann, Nathan R. Newbury
Frequency combs provide broadband spectroscopic measurements with high frequency accuracy and precision. However, because the comb power is distributed over a broad spectrum, the sensitivity can be low unless some form of multiplexed detection or cavity

FRACTURE OF TOOTH ENAMEL FROM INCIPIENT MICROSTRUCTURAL DEFECTS

June 14, 2010
Author(s)
H Chai, James J. Lee, Brian R. Lawn
We present definitive evidence for crack growth from internal defects called 'tufts' in human enamel. Side walls of slices sawn from extracted human teeth are observed during loading to 'failure'. 'Longitudinal' and 'transverse' slices (parallel and normal

Interlaboratory Comparison of Traceable Atomic Force Microscope Pitch Measurements

June 14, 2010
Author(s)
Ronald G. Dixson, Donald Chernoff, Shihua Wang, Theodore V. Vorburger, Ndubuisi G. Orji, Siew-Leng Tan, Joseph Fu
The National Institute of Standards and Technology (NIST), Advanced Surface Microscopy (ASM), and the National Metrology Centre (NMC) of the Agency for Science, Technology, and Research (A*STAR) in Singapore have undertaken a three-way interlaboratory

Introduction to Surface Finish Metrology

June 14, 2010
Author(s)
Theodore V. Vorburger
We discuss the range of methods available to measure surface finish and emphasize the methods of stylus profiling and various types of optical profiling. Documentary standards for measurement of surface texture and comparisons between methods are also

Observation of Transparency of Erbium-doped Silicon nitride in photonic crystal nanobeam cavities

June 14, 2010
Author(s)
Yiyang Gong, Maria Makarova, Selcuk Yerci, Rui Li, Martin Stevens, Burm Baek, Sae Woo Nam, Luca Dal Negro, Jelena Vuckovic
One dimensional nanobeam photonic crystal cavities are fabricated in an Er-doped amorphous silicon nitride layer. Photoluminescence from the cavities around 1.54 mm is studied at cryogenic and room temperatures at different optical pump powers. The

Real Time Data Acquisition Platform for Pulsed Measurements

June 14, 2010
Author(s)
Sergey V. Polyakov, Alan L. Migdall, Sae Woo Nam
We present an inexpensive and simple data acquisition platform based on Field Programmable Gate Arrays (FPGAs) designed to acquire and characterize fast digital or analog electrical signal real time for processing on a generic personal computer. While the

A New Electronic Verification Method for Vector Network Analyzers

June 13, 2010
Author(s)
Ronald A. Ginley, Dylan F. Williams, Denis X. LeGolvan
The National Institute of Standards and Technology (NIST) has recently introduced a new method for the verification of Vector Network Analyzers (VNAs). The technique is based on the new electronic calibration units that are available from several

Calibrations of Current-to-Voltage Transimpedance Amplifiers Using Electrical Standards

June 13, 2010
Author(s)
Howard W. Yoon, George P. Eppeldauer, Dean G. Jarrett, Thomas C. Larason, Wan-Seop Kim
For photocurrent measurements with low uncertainties, a wide-dynamic range current-to-voltage converter traceable to resistance standards has been developed at the NIST. The design and calibration of the converter standard are described. For validation

Comparison of Near-Field Methods at NIST

June 13, 2010
Author(s)
Katherine MacReynolds
A comparison of the planar, spherical and cylindrical near-field techniques was completed at the National Institute of Standards and Technology (NIST) for a Ku-band cassegrain reflector antenna. This paper discusses the measurement results for the near-to

Design of the NIST 10 V programmable Josephson voltage standard system

June 13, 2010
Author(s)
Charles J. Burroughs, Paul Dresselhaus, Alain Rufenacht, Mike Elsbury, Samuel Benz
NIST has developed and implemented a new Programmable Josephson Voltage Standard (PJVS) that operates at 10 V. This next-generation system is optimized for both dc metrology and stepwise-approximated ac voltage measurements for frequencies up to a few
Displaying 49401 - 49425 of 143780
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