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Displaying 47651 - 47675 of 143793

A Mathematical Model of Atmospheric Retention of Man-made CO_2 Emissions

December 21, 2010
Author(s)
Bert W. Rust
Rust and Thijsse [Proc. CSC'07 (2007) pp. 10-16], [CiSE, Vol. 10 (2008) pp. 49-59] have shown that global annual average temperature anomalies T(t) vary linearly with atmospheric CO_2 concentrations c(t). The c(t) can be related to man-made CO_2 emissions

Characterizing a Scatterfield Optical Platform for Semiconductor Metrology

December 21, 2010
Author(s)
Bryan M. Barnes, Ravikiran Attota, Richard Quintanilha, Martin Y. Sohn, Richard M. Silver
Scatterfield microscopy is the union of a high-magnification imaging platform and the angular and/or wavelength control of scatterometry at the sample surface. Scatterfield microscopy uses Köhler illumination, where each point on the source translates to a

Combined scanning probe and light scattering characterization of multi-stage self-assembly of targeted liposome-based delivery systems

December 21, 2010
Author(s)
Natalia Farkas, John A. Dagata, Chengli Yang, Antonina Rait, Kathleen Pirollo, Esther Chang
The mean size and size distribution of a targeted nanoparticle delivery system (NDS) strongly influences the intrinsic stability and functionality of this molecular complex, affects its performance as a systemic drug delivery platform, and ultimately

Scanning Probe Microscope Dimensional Metrology at NIST

December 21, 2010
Author(s)
John A. Kramar, Ronald G. Dixson, Ndubuisi G. Orji
Scanning probe microscopy (SPM) dimensional metrology efforts at the U.S. National Institute of Standards and Technology are reviewed. The main SPM instruments for realizing the International System of Units (SI) are the Molecular Measuring Machine, the

TDCR Measurements on Pu-241 at NIST

December 21, 2010
Author(s)
Denis E. Bergeron, Brian E. Zimmerman
We have performed a series of measurements on a Pu-241 solution using the triple-to-double coincidence ratio (TDCR) liquid scintillation technique. A similar series of measurements in 2007 revealed significant discord between activity values determined via

Benchmarks, Performance Evaluation and Contests for 3D Shape Retrieval

December 20, 2010
Author(s)
Afzal A. Godil, Zhouhui Lian, Helin Dutagaci
Benchmarking of 3D Shape retrieval allows developers and researchers to compare the strengths of different algorithms on a standard dataset. Here we discuss the different steps involved in developing a benchmark and some of the issues involved. We then

Common Reference Channels for Metrological Comparability

December 20, 2010
Author(s)
Ruediger Kessel, Tim Hewison
In this article we discuss the effect of the choice of reference during calibration on later use of the calibrated results, and how a reference should be chosen to support later use of the data. Starting from the concept of metrological comparability we

Femtotesla atomic magnetometry in a microfabricated vapor cell

December 20, 2010
Author(s)
William C. Griffith, Svenja A. Knappe, John Kitching
We describe an optically pumped 87Rb magnetometer with 4.5 fT/Hz 1/2 sensitivity when operated in the spin-exchange relaxation free (SERF) regime. The magnetometer uses a microfabricated vapor cell, consisting of a cavity etched in a 1 mm thick silicon

Progress at NIST in measuring the D-lines of Li isotopes using an optical frequency comb

December 20, 2010
Author(s)
Clayton Simien, Samuel M. Brewer, Joseph N. Tan, John D. Gillaspy, Craig J. Sansonetti
Precise spectroscopic experiments with light atoms can provide information about nuclear properties that are very difficult to obtain in electron scattering experiments. For example, relative nuclear radii of low-Z isotopes can be determined accurately
Displaying 47651 - 47675 of 143793
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