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Displaying 46676 - 46700 of 73994

Microwave Dielectric Property Measurements

January 1, 2001
Author(s)
Richard G. Geyer, Jerzy Krupka
Materials, whether in the solid, liquid or gaseous states, may be electrically nonlinear, anisotropic, inhomogeneous and dispersive with respect to frequency. Dispersion results from loss mechanisms that differ in different types of materials and vary with

Microwave Synthesizers for Atomic Frequency Standards

January 1, 2001
Author(s)
A Sen gupta, F Garcia nava, Craig Nelson, David A. Howe, F L. Walls
Following our earlier work on a new approach to synthesising the Cs hyperfine frequency of 9.192 GHz, we describe developments on its further refinements. The salient feature of our design is that it is based mainly on frequency division and requires no

Misalignment-Induced Bending in Pin-Loaded Tensile-Creep Specimens

January 1, 2001
Author(s)
Ralph Krause, Sheldon M. Wiederhorn, J J. Kuebler
In this paper, we examined the possibility that elastic bending induced by load misalignment can affect creep measurements on pin-loaded tension specimens of silicon nitride(Si 3N 4). We have shown that elastic bending ato room temperature can be as great

Modeling Thermal Barrier Coatings with Object Oriented Finite Elements Methods

January 1, 2001
Author(s)
M R. Locatelli, Lin-Sien H. Lum
Thermal barrier coatings (TBC s) are used to protect metallic components from extreme conditions like those encountered in turbine engines. TBC s serve two purposes in these applications. They prevent the oxidation of the superalloy and create a thermal

Modeling, Simulation and Prediction of Rockwell Hardness Indentation

January 1, 2001
Author(s)
Li Ma, J Zhou, Theodore V. Vorburger, R Dewit, Richard J. Fields, Samuel Low, Jun-Feng Song
Rockwell hardness test, as a measure of the resistance of a material to localized plastic deformation, is a valuable and widely used mechanical test. However, the accuracy of Rockwell hardness measurement is still in question. The indenter, including both

Molecular Measuring Machine Design and Performance

January 1, 2001
Author(s)
John A. Kramar, Jay S. Jun, William B. Penzes, Vincent P. Scheuerman, Fredric Scire, E C. Teague
We have developed a metrology instrument called the Molecular Measuring Machine (M3) with the goal of performing two-dimensional point-to-point measurements with nanometer-level uncertainties over a 50 mm by 50 mm area. The scanning tunneling microscope

MSIDs Continuous Improvement Activities

January 1, 2001
Author(s)
Sharon J. Kemmerer, Kristy D. Thompson
The purpose of this document is to provide status on two continuous improvement projects internal to the National Institute of Standards and Technology (NIST), Manufacturing Engineering Laboratory (MEL), in its Manufacturing Systems Integration Division

Multimode Lasing at Room Temperature from InGaAs/GaAs Quantum Dot Lasers

January 1, 2001
Author(s)
Benjamin D. Klein, Kevin L. Silverman, Richard Mirin
We demonstrate InGaAs/GaAs quantuum dot lasers with multimode lasing at room temperature immediately above threshold. The lasing modes are separated by about ten times the Fabry-Perot mode spacing, with several dark modes in between the lasing modes. Rate

Nano-Lubrication: Concept and Design

January 1, 2001
Author(s)
Stephen M. Hsu
The advent of micro-electromechanical devices (MEMs), sensors, actuators, microsystems, and nanotechnology have called to attention the effect of friction on moving parts in nano/microdevices. To take full advantage of the opportunity to sense, compute
Displaying 46676 - 46700 of 73994
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