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Displaying 45676 - 45700 of 74024

Security Requirements for Cryptographic Modules [includes Change Notices as of 12/3/2002]

May 25, 2001
Author(s)
National Institute of Standards and Technology (NIST), Annabelle Lee, Miles E. Smid, Stanley R. Snouffer
This Federal Information Processing Standard (140-2) specifies the security requirements that will be satisfied by a cryptographic module, providing four increasing, qualitative levels intended to cover a wide range of potential applications and

Physical and Chemical Aspects of Fire Suppression in Extraterrestrial Environments

May 22, 2001
Author(s)
Fumiaki Takahashi, Gregory T. Linteris, Vishwanath R. Katta
A fire, whether in a spacecraft or in occupied spaces on extraterrestrial bases, can lead to mission termination or loss of life. While the fire-safety record of US space missions has been excellent, the advent of longer duration missions to Mars, the moon

Trioxane-Air Counterflow Diffusion Flames in Normal and Microgravity

May 22, 2001
Author(s)
Gregory T. Linteris, M D. Rumminger, D L. Urban
Trioxane, a weakly bound polymer of formaldehyde (C3H6O3, melting point 61 deg C, boiling point 115 deg C), is a uniquely suited compound for studying material flammability. Like many of the more commonly used materials for such tests (e.g. delrin

Broadband Josephson Voltage Standards

May 20, 2001
Author(s)
Clark A. Hamilton, Samuel P. Benz
A Josephson junction is a perfect frequency to voltage converter, that is, V=f/K j where K j = 483597.9 GHz/V. This unique property has been used to convert a narrow (1 Hz) band 75 GHz reference frequency to a dc voltage standard. Josephson standards use

A Statistical Test Suite for Random and Pseudorandom Number Generators for Cryptographic Applications

May 15, 2001
Author(s)
Andrew L. Rukhin, Juan Soto, James R. Nechvatal, Miles E. Smid, Elaine B. Barker, Stefan D. Leigh, M Levenson, M Vangel, D L. Banks, Nathanael A. Heckert, James F. Dray Jr., S C. Vo
[Superseded by SP 800-22 Revision 1a (April 2010): http://www.nist.gov/manuscript-publication-search.cfm?pub_id=906762] This paper discusses some aspects of selecting and testing random and pseudorandom number generators. The outputs of such generators may

Report on Forum 2000: Fluid Properties for New Technologies - Connecting Virtual Design with Physical Reality

May 14, 2001
Author(s)
James C. Rainwater, Daniel G. Friend, Howard J. Hanley, Allan H. Harvey, C D. Holcomb, Arno D. Laesecke, Joe W. Magee, Chris D. Muzny
Forum 2000, which addressed the present needs and priorities for thermophysical properties measurements, was held June 29, 2000, at the 14th Symposium for Thermophysical Properties in Boulder, Colorado. Seven distinguished experts presented overviews of

Challenges of High-[kappa] Gate Dielectrics for Future MOS Devices

May 13, 2001
Author(s)
John S. Suehle, Eric M. Vogel, Monica D. Edelstein, Curt A. Richter, Nhan Van Nguyen, Igor Levin, Debra Kaiser, Hanchang F. Wu, J B. Bernstein
As the feature sizes of complementary metal-oxide-semiconductor (CMOS) devices are scaled downward, the gate dielectric thickness must also decrease to maintain a value of capacitance to reduce short-channel effects and to keep device drive current at an

Compressive Strengthening of Sapphire by Neutron Irradiation

May 9, 2001
Author(s)
T M. Regan, D C. Harris, R M. Stroud, J R. White, D W. Blodgett, K C. Baldwin, J A. Miragliotta, M E. Thomas, M J. Linevsky, J W. Giles, T A. Kennedy, M Fatemi, David R. Black
Neutron irradiation of sapphire with 1 1022(=1 MeV)/m2 increases the c-axis compressive strength by a factor of 3 at 600 C. The mechanism of strength enhancement is the retardation of r-plane twin propagation by radiation-induced defects. 10B and Cd

AC and DC Voltages From a Josephson Arbitrary Waveform Synthesizer

May 7, 2001
Author(s)
Samuel P. Benz, Charles J. Burroughs, Paul D. Dresselhaus, Laurie Christian
We have synthesized and measured ac and dc voltages using a Josephson arbitrary waveform synthesizer. On-chip filtering has enabled the first practical operating margins for ac and arbitrary waveforms. Using a digital voltmeter, we demonstrate the

Use of the Oscillation Based Built-in Self-test Method for Smart Sensor Devices

May 7, 2001
Author(s)
Angela Hodge, R. Newcomb, Allen R. Hefner Jr.
An oscillation-based built in self-test (BIST) method is presented for functional testing of mixed signal devices. An integral component of this method of on-chip testing involves transforming an oscillating analog signal into a digital clock-like signal

A Method to Compare Vector Nonlinear Network Analyzers

May 1, 2001
Author(s)
Kate Remley, Donald C. DeGroot, Jeffrey Jargon, Kuldip Gupta
We address the difficult problem of determining measurement consistency between two vector nonlinear network analyzers, a new class of stimulus-response instruments that acquire multiharmonic waveform data instead of normalized network parameters. We

A New Stable Speed Test Apparatus for Milling

May 1, 2001
Author(s)
J P. Snyder, Jon R. Pratt, Matthew A. Davies, S J. Smith
This paper describes a new device that uses a non-contact force actuator in conjunction with spindle rotation to produce an impulsive periodic driving force on the tool at the tooth passing frequency. Measurements are made of the applied and of the

A Phase-Field Model With Convection: Sharp-Interface Asymptotics

May 1, 2001
Author(s)
D M. Anderson, Geoffrey B. McFadden, A A. Wheeler
We have previously developed a phase-field model of solidification that includes convection in the melt. This model represents the two phases as viscous liquids, where the putative solid phase has a viscosity much larger than the liquid phase. The object

A Preliminary Information Model for a Supply Chain Simulation

May 1, 2001
Author(s)
Shigeki Umeda, Charles R. McLean, Yung-Tsun T. Lee
This paper provides an overview of the information model that is under development for the simulation of a manufacturing supply chain. The supply chain simulation is being developed to validate interface specifications as part of the Intelligent

Analysis of Stresses in Aluminum-Silicon Alloys

May 1, 2001
Author(s)
A Saigal, Lin-Sien H. Lum
Two-phase aluminum-silicon-based alloys are widely used for premium quality castings for aerospace and automotive applications. While it is clear that silicon improves fluidity in the molten state, providing excellent castability to the alloy, and
Displaying 45676 - 45700 of 74024
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