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Displaying 45676 - 45700 of 74141

A Model for the Flow of Design Information in OpenADE

June 1, 2001
Author(s)
Steven Shooter, Walid Keirouz, Simon Szykman, Steven J. Fenves
This working document describes OpenADE's agent-based architecture. The goal for developing this architecture is to support information exchange and interoperability between design agents throughout the life-cycle of an artifact. The architecture itself is

A Model of Chemical Mechanical Polishing

June 1, 2001
Author(s)
E W. Paul
A model of chemical mechanical modeling (CMP) is presented which quantitatively correlates the polishing rate with the slurry concentrations of both chemicals and abrasives. The model predicts that as the concentration of either chemicals or abrasives is

A New Type of Frequency Chain and its Application to Fundamental Frequency Metrology

June 1, 2001
Author(s)
Thomas Udem, J Reichert, R Holzwarth, Scott Diddams, D J. Jones, Jun Ye, S T. Cundiff, T W. Hansch, John L. Hall
A suitable femtosecond (fs) laser system can provide a broad band comb of stable optical frequencies and thus can serve as an rf/opticalcoherent link. In this way we have performed a direct comparison of the 1 S - 2S transition in atomic hydrogen at 121 nm

AlGaN Schottky Diodes for Short-Wavelength UV Applications

June 1, 2001
Author(s)
P P. Chow, J J. Klaassen, Robert E. Vest, J M. VanHove, A Wowchak, C Polley
High performance ultraviolet (UV) detectors have been fabricated using plasma-enhanced molecular beam epitaxy (MBE). The realized AlGaN Schottky detectors exhibit high responsivity, sharp spectral cutoff and high shunt resistance of several giga-ohns for 0

Analysis of Dimensional Metrology Standards

June 1, 2001
Author(s)
Thomas R. Kramer, John Evans, Simon P. Frechette, John A. Horst, Hui-Min Huang, Elena R. Messina, Frederick M. Proctor, William G. Rippey, Harry A. Scott, Theodore V. Vorburger, Albert J. Wavering
This is an analysis of standards related to dimensional metrology, with recommendations regarding standards development. The analysis focuses on the degree to which existing and developing standards provide a complete set of non-overlapping specifications

Analytic Sampling-Circuit Model

June 1, 2001
Author(s)
Dylan F. Williams, Catherine A. Remley
Abstract: We develop analytic expressions for the impulse response and kickout pulses of a simple sampling circuit that incorporate the nonlinear junction capacitance of the sampling diode. We examine the effects of both the time-varying junction

Analyzing Load History Dependence of Fracture in Structural Adhesives

June 1, 2001
Author(s)
Donald L. Hunston
The most common toughening mechanisms in structural adhesives are viscoelastic processes which means that the fracture enrgies for bulk adhesive specimens and bonded joints will vary with loading history. Although this is well known, relaviely few studies

Architectures in an XML World

June 1, 2001
Author(s)
Joshua Lubell
XML[Extensible Markup Language] developers today have at their disposal a variety of tools for achieving schema reuse. An often-overlooked reuse method is the specification of architectures for creating and processing data. Experience with APEX, an

Atomic Engineering of Spin Valves Using Ag as a Surfactant

June 1, 2001
Author(s)
D X. Yang, B Shashishekar, H D. Chopra, P J. Chen, William F. Egelhoff Jr.
In this study, de magnetron sputtered NiO (50 nm)/Co (2.5 nm)/Cu (1.5 nm)/Co(3.0 nm) bottom spin valves were studied with and without Ag as a surfactant. At Cu spacer thickness of 1.5 nm, a strong positive coupling >13.92 kA/m (>175 Oe) between NiO-pinned

Atomic Spectroscopy at NIST 2001

June 1, 2001
Author(s)
Joseph Reader
The program in atomic spectroscopy at NIST continues to provide accurate reference data on spectral lines and energy levels for a wide variety of important applications. With spectrometers at NIST that can record spectra from the extreme ultraviolet (1 nm)

Characterizing Interfacial Roughness by Light Scattering Ellipsometry

June 1, 2001
Author(s)
Thomas A. Germer
The polarization of light scattered by oxide films thermally grown on photolithographically-generated microrough silicon surfaces was measured as functions of scattering angle. Using the predictions of first-order vector perturbation theory for scattering

Chemical Crosstalk Between Heated Gas Microsensor Elements Operating in Close Proximity

June 1, 2001
Author(s)
M C. Wheeler, J E. Tiffany, R M. Walton, Richard E. Cavicchi, Stephen Semancik
Gas microsensor arrays often have closely-spaced elements typically separated by hundreds of microns. For such devices, crosstalk between elements operated within a gaseous environment is a concern because sensing materials held at elevated temperatures

Electrical CD Metrology and Related Reference Materials

June 1, 2001
Author(s)
Michael W. Cresswell, Richard A. Allen
In the fabrication of integrated circuits, the steps of depositing a thin film of conducting material, patterning it photo-lithographically, and then etching it and stripping the remaining resist, are repeated several times as required levels are created

Engineering Principles for Information Technology Security

June 1, 2001
Author(s)
G Stoneburner
In June 2001, ITL released NIST Special Publication (SP) 800-27, Engineering Principles for Information Technology Security (EP-ITS), by Gary Stoneburner, Clark Hayden, and Alexis Feringa. Engineering Principles for Information Technology (IT) Security (EP
Displaying 45676 - 45700 of 74141
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