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Formation of stacking faults and their correlation with flux-pinning and critical current density for Sm-doped YBa2Cu3O7-x films

Published

Author(s)

Winnie K. Wong-Ng, Sung H. Wee, Eliot D. Specht, Claudia Cantoni, Jonathan Zuegel, Victor Maroni, Guangyao Liu, Timothy J. Haugan, Amit Goyal

Abstract

A correlation between flux-pinning characteristics and stacking faults (SFs) formed by Sm substitution on Y and Ba sites was found in Sm-doped YBCO films. It was confirmed that “223” type SFs, Y2Ba2Cu3Ox, composed of Y and O extra planes aligned parallel to the ab-planes were formed via Sm substitution on the Y site and increased in number with increased Sm doping on the Ba site. The number density of “223” SFs is correlated strongly with the enhancement in ab-plane correlated flux-pinning, resulting in a sharpening of the H ab peak in the curve of Jc as function of magnetic field orientation.
Citation
Applied Physics Letters
Volume
83

Keywords

superconductors, flux pinning, critical current density, Sm-doped YBa2Cu3O7-x films, stacking faults

Citation

Wong-Ng, W. , Wee, S. , Specht, E. , Cantoni, C. , Zuegel, J. , Maroni, V. , Liu, G. , Haugan, T. and Goyal, A. (2011), Formation of stacking faults and their correlation with flux-pinning and critical current density for Sm-doped YBa2Cu3O7-x films, Applied Physics Letters, [online], https://doi.org/10.1103/PhysRevB.83.224520 (Accessed May 30, 2024)

Issues

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Created June 29, 2011, Updated November 10, 2018