Wong-Ng, W.
, Wee, S.
, Specht, E.
, Cantoni, C.
, Zuegel, J.
, Maroni, V.
, Liu, G.
, Haugan, T.
and Goyal, A.
(2011),
Formation of stacking faults and their correlation with flux-pinning and critical current density for Sm-doped YBa2Cu3O7-x films, Applied Physics Letters, [online], https://doi.org/10.1103/PhysRevB.83.224520
(Accessed April 25, 2024)
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Formation of stacking faults and their correlation with flux-pinning and critical current density for Sm-doped YBa2Cu3O7-x films
Published
Author(s)
, Sung H. Wee, Eliot D. Specht, Claudia Cantoni, Jonathan Zuegel, Victor Maroni, , Timothy J. Haugan, Amit Goyal
Abstract
A correlation between flux-pinning characteristics and stacking faults (SFs) formed by Sm substitution on Y and Ba sites was found in Sm-doped YBCO films. It was confirmed that 223 type SFs, Y2Ba2Cu3Ox, composed of Y and O extra planes aligned parallel to the ab-planes were formed via Sm substitution on the Y site and increased in number with increased Sm doping on the Ba site. The number density of 223 SFs is correlated strongly with the enhancement in ab-plane correlated flux-pinning, resulting in a sharpening of the H ab peak in the curve of Jc as function of magnetic field orientation.Citation
Applied Physics Letters
Volume
83
Pub Type
Journals
Download Paper
Keywords
superconductors, flux pinning, critical current density, Sm-doped YBa2Cu3O7-x films, stacking faults
Citation
Created June 29, 2011, Updated November 10, 2018