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NIST Authors in Bold

Displaying 43376 - 43400 of 73697

Empirical Modeling Methods Using Partial Data

April 1, 2002
Author(s)
Gerard N. Stenbakken, Ruimin Liu, Gene Huang
Methods were developed to calculate empirical models for device error behavior from data sets with missing data. These models can be used to develop reduced point testing procedures for the devices. The partial data methods reduce the prediction

Friction Measurements of Ultra-Thin Carbon Overcoats in Air

April 1, 2002
Author(s)
P M. McGuiggan, C S. Bhatia, D Bogy, W Fong, Stephen M. Hsu
The friction force as a function of humidity was measured between 5 nm thick carbon films coated onto mica surfaces. The friction was found to be proportional to the area of contact. The shear stress at 0%, 33%, and 100% humidity was measured to be 25 +6

Grafting Segments from the Extracellular Surface of CCR5 onto a Bacteriorhodopsin Transmembrane Scaffold Confers HIV-1 Corcceptor Activity

April 1, 2002
Author(s)
N G. Abdulaev, T T. Strassmaier, T Ngo, R W. Chen, H Lueke, D D. Oprian, K D. Ridge
The G-protein coupled receptor CCR5 binds three distinct B-chemokines on the solvent exposed segments of the extracellular surface. This same region of CCr5 also interacts with certain macrophage-tropic strains of HIV-1. To investigate structural features

High Throughput Methods for Materials R&D: A Growing Effort at NIST

April 1, 2002
Author(s)
Leonid A. Bendersky, J D. Hewes
The U.S. private sector has indicated that the National Institute of Standards and Technology has a role to play in facilitating the implementation of high throughput experimentation, for example using combinatorial methods. The Advanced Technology Program

Improved IDDQ Testing With Empirical Linear Prediction

April 1, 2002
Author(s)
David I. Bergman, Hans Engler
A new linear prediction method that improves IDDQ test effectiveness is described. The method uses statistical pre-processing of exhaustive measurements on training devices to extract principal patterns in the device IDDQ behavior and to generate a

Influence of Processing Rate and Formulation on the Interface Strength of Vinyl Ester/E-Glass Composites

April 1, 2002
Author(s)
Walter G. McDonough, Joy Dunkers, Gale A. Holmes, E Feresenbet, Y H. Kim, Richard~undefined~undefined~undefined~undefined~undefined Parnas
The single fiber fragmentation test was used to investigate the effect of gelation time on interfacial shear properties of fast reacting resin systems. We developed a processing system capable of producing single fiber fragmentation samples with gelation

It's Bound to Be Right

April 1, 2002
Author(s)
Isabel M. Beichl, F Sullivan
This is a tutorial article on a Monte Carlo method for eliminating double counting in massive data sets. It has also been used to classify images.

Measurement of the Linewidth of Electrical Test-Structure Reference Features by Automated Phase-Contrast Image Analysis

April 1, 2002
Author(s)
B A. am Ende, Michael W. Cresswell, Richard A. Allen, T J. Headley, William F. Guthrie, Loren W. Linholm, H Bogardus, Christine E. Murabito
NIST, Sandia National Laboratories, and International SEMATECH are developing a new type of linewidth standard for calibrating Critical Dimension (CD) metrology instruments for lithographic process control. The standard reference feature is the bridge of

Momentum Dependence of Fluorine K-Edge Core Exciton in LiF

April 1, 2002
Author(s)
K Hamalainen, S Galambosi, J A. Soininen, Eric L. Shirley, A Shukla, J P. Rueff
Non-resonant inelastic x-ray scattering spectra have been measured with an energy loss close to the fluorine K-edge of lithium fluoride. The extracted dynamic structure factor is well reproduced by an ab initio computational scheme that takes the electron

NIST Metric Pyramid

April 1, 2002
Author(s)
J B. McCracken
Paper cut-out pyramid, 10 cm x 10 cm x 10 cm, listing metric conversion information on each face covering units of length, mass or weight, area or surface, energy, volume and temperature. The bottom face lists metric symbols.
Displaying 43376 - 43400 of 73697
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