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Displaying 37951 - 37975 of 74256

New Capabilities At NIST In Dimensional Metrology

January 1, 2005
Author(s)
Theodore D. Doiron, Eric S. Stanfield, Bryon S. Faust, John R. Stoup, Mary Abbott
A number of new or revised services in dimensional metrology are presented. Included are: a lower cost, high accuracy calibration for sphere diameter; reduced uncertainty in roundness calibration; a new instrument for measurement of the thermal expansion

New Magnetic Phases of bcc-Co Thin Films

January 1, 2005
Author(s)
T Monchesky, John Unguris
We have been able to observe two new magnetic phases of ultrathin Co by growing atomically well ordered Co films on cleaved GaAs(110) substrates. For a Co thickness less than 3.4 monolayers (ML), we find a ferromagnetically dead layer associated with the

NIST Atomic Spectra Database

January 1, 2005
Author(s)
Yuri Ralchenko, F -. Jou, Daniel E. Kelleher, Alexander Kramida, Arlene Musgrove, Joseph Reader, Wolfgang L. Wiese, Karen J. Olsen

NIST Symposium Reports Advances in Fiber Optic Measurements

January 1, 2005
Author(s)
Kent B. Rochford
SOFM 2004 took place September 28-30, and was hosted by NIST's Optoelectronics Division in Boulder, Colorado, in cooperation with the Optical Society of America and the IEEE Lasers and Electro-Optics Society. It brought scientists from 15 countries, and
Displaying 37951 - 37975 of 74256
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