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Displaying 37951 - 37975 of 74299

Measurement Of Parity Violation In Np Capture: The Npdgamma Experiment

January 1, 2005
Author(s)
S A. Page, J D. Bowman, R D. Carlini, T Case, T E. Chupp, K A. Coulterpark, M Dabaghyan, D Desai, S J. Freedman, Thomas R. Gentile, M T. Gericke, R C. Gillis, G L. Greene, F W. Hersmann, T Ino, S Ishimoto, G L. Jones, B Lauss, M B. Leuschner, B Losowski, R Mahurin, Y Masuda, G S. Mitchell, H Nann, S I. Penttila, W D. Ramsay, S Santra, P -. Seo, E I. Sharapov, T B. Smith, W M. Snow, W S. Wilburn, V Yuan, H Zhu

Measurement Uncertainty, CMMs, and Standards: Today and the Future

January 1, 2005
Author(s)
Steven D. Phillips
Over the past decade modern measurement uncertainty evaluation has evolved from an obscure art practiced at National Measurement Institutes (NMIs) to an increasingly intertwined aspect of industrial metrology. This paper examines the progression of

Measurements of phase shifts in an inertance tube

January 1, 2005
Author(s)
Michael A. Lewis, Peter E. Bradley, Ray Radebaugh, Ercang Lou
Phase shifts and mass flows were measured at the inlet of an inertance tube. and the results are compared with transmission line models. The mass flow rates at the entrance to the inertance tube are obtained using a hot-wire anemometer. The hot wire was

Mechanical properties of structural steel:

January 1, 2005
Author(s)
William E Luecke, J David McColskey, Christopher N McCowan, Stephen W Banovic, Richard J Fields, Timothy Foecke, Thomas A Siewert, Frank W Gayle

Microchannel Confined Surface Initiated Polymerization

January 1, 2005
Author(s)
Chang Xu, Tao Wu, Charles M. Drain, J Batteas, Kathryn L. Beers
Surface initiated atom transfer radical polymerization was successfully carried out inside a microchannel, which was formed by placing a patterned poly(dimethylsiloxane) (PDMS) stamp on top of an initiator modified flat silicon substrate. Both surface

Microfabricated Atomic Clocks

January 1, 2005
Author(s)
John E. Kitching, Svenja A. Knappe, Li-Anne Liew, P Schwindt, V Shah, John M. Moreland, Leo W. Hollberg
We describe recent progress at NIST in the development of compact, low-power atomic frequency references based on microfabrication processes. The physics packages of these frequency references have a volume near 10 cm 3, require less than 100 mW of power
Displaying 37951 - 37975 of 74299
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