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Displaying 37951 - 37975 of 74202

On Higher Order Corrections for Propagating Uncertainties

January 1, 2005
Author(s)
Chih-Ming Wang, Hariharan K. Iyer
The ISO Guide to the Expression of Uncertainty in Measurement (GUM) recommends the use of a first-order Taylor series expansion for propagating errors and uncertainties. The GUM also suggests the use of a second-order Taylor series approximation for

Optical Anisotropy of Sheared Carbon-Nanotube Suspensions

January 1, 2005
Author(s)
D J. Fry, B Langhorst, H W. Kim, E A. Grulke, Haonan Wang, Erik K. Hobbie
We measure the anisotropy of sheared carbon nanotube suspensions for a range of concentration, aspect ratio, and strain rate using a variety of methods. Our measurements highlight the importance of hydrodynamic interactions, with scaling over a broad range

Optoelectronics Division Programs, Activities, and Accomplishments

January 1, 2005
Author(s)
Kent B. Rochford
The NIST Optoelectronics Division provides measurement technology, standards, and traceability for the optoelectronics industry. This document describes the programs, activities, and accomplishments of the Division during the the 2004 fiscal year. It is

Panoramic, Ultrawideband, Diagnostic Imaging of Test Volumes

January 1, 2005
Author(s)
David R. Novotny, Robert T. Johnk, Chriss A. Grosvenor, Seturnino Canales
This paper presents developing methodologies to assess the quality and range of use (in frequency, test volume size, and test type) of EMC test facilities. Previous efforts [1-2] have focused on transmission tests that represented typical antenna and test

Passive fire protection:

January 1, 2005
Author(s)
Nicholas J Carino, Monica A Starnes, John L Gross, Jiann C Yang, Scott R Kukuck, Kuldeep R Prassad, Richard W Bokowski
Displaying 37951 - 37975 of 74202
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