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Displaying 34951 - 34975 of 73697

Fiber Deflection Probe for Small Hole Metrology

January 1, 2006
Author(s)
Balasubramanian Muralikrishnan, Jack A. Stone Jr., John R. Stoup
This paper presents the development of a new probing method for Coordinate Measuring Machines (CMM) to inspect diameter and form of small holes. The technique, referred to as fiber deflection probing, can be used for holes of approximately 100 mm nominal

Fiber Deflection Probe Uncertainty Analysis for Micro Holes

January 1, 2006
Author(s)
Bala Muralikrishnan, Jack A. Stone Jr., John R. Stoup
We have recently reported on a new probe, the Fiber Deflection Probe (FDP), for diameter and form measurement of large aspect ratio micro-holes (100 um nominal diameter, 5 mm deep). In this paper, we briefly review the measurement principle of the FDP

Final Report of WPEC Subgroup 7

January 1, 2006
Author(s)
S Tagesen, H Vonach, F J. Hambsch, Z Chen, H M. Hofmann, K Shibata, S Y. Oh, S A. Badikov, E V. Gai, V G. Pronyaev, D L. Smith, G M. Hale, T Kawano, Allan D. Carlson, N M. Larson

FIRE SUPPRESSANT DISTRIBUTION IN AN ENGINE NACELLE

January 1, 2006
Author(s)
David R. Keyser, J C. Hewson
The flow inside an engine nacelle ground test simulator is studied for the purpose of understanding and optimizing the distribution of suppressant. One objective of this study is to identify conditions for which suppression will and will not be successful

Flow visualization of heated CO2 gas using thermal imaging

January 1, 2006
Author(s)
Joseph P. Rice, Howard W. Yoon, M H. Brenner, N R. Briggs, J G. Gillen
Walk-through portal detection systems are being developed to screen passengers for the presence of explosives in support of homeland security. These portals utilize a series of air-jets to remove the explosive particles for detection using ion mobility

Force Calibration Via Electrostatics

January 1, 2006
Author(s)
Jon R. Pratt, John A. Kramar, Gordon A. Shaw, Lee Kumanchik
We describe the electrical and length measurements necessary to realize micronewton forces in a fashion consistent with the International System of Units (SI). We first discuss instrumentation and procedures required to accurately characterize an

Form-Profiling of Optics Using the Geometry Measuring Machine and NIST M-48 CMM

January 1, 2006
Author(s)
Nadia Machkour-Deshayes, John R. Stoup, John Lu, Johannes A. Soons, Ulf Griesmann, Robert S. Polvani
We are developing an instrument, the Geometry Measuring Machine (GEMM), to measure the profile errors of aspheric and free form optical surfaces, which require measurement uncertainties near 1nm. Using GEMM, an optical profile is reconstructed from a set
Displaying 34951 - 34975 of 73697
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