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Displaying 27326 - 27350 of 73830

A Hybrid Frame Concealment Algorithm for H.264/AVC

January 5, 2010
Author(s)
Hamid Gharavi
In packet-based video transmissions, packets loss due to channel errors may result in the loss of the whole video frame. Recently, many error concealment algorithms have been proposed in order to combat channel errors, however most of the existing

Demonstrating the metrological compatibility of uranium isotope amount ratio measurement results performed by GSMS, TIMS and MC-ICPMS techniques

January 5, 2010
Author(s)
Olivio Pereira de Oliveira, Willy De Bolle, Stefan Richter, Adolfo Alonso, Emmanuel Ponzevera, Christophe Qu?tel, Jorge Eduardo de Souza Sarkis, Roger Wellum, Ruediger Kessel
The metrological compatibility of n(234U)/n(238U), n(235U)/n(238U) and n(236U)/n(238U) isotope amount ratio measurement results performed by gas source mass spectrometry (GSMS), thermal ionisation mass spectrometry (TIMS) and multi-collector inductively

High Throughput Techniques for Fire Retardant Materials Development

January 5, 2010
Author(s)
Rick D. Davis, Richard E. Lyon
None was required. Here is the last paragraph of the introduction. In this chapter are examples of how we used HT to accelerate knowledge about polymer materials. The first case study describes the development and application of HT tools and methods to

Low-Cost, High-Throughput, Automated Counting of Bacterial Colonies

January 5, 2010
Author(s)
Matthew L. Clarke, Robert L. Burton, A. N. Hill, Maritoni A. Litorja, Moon H. Nahm, Jeeseong Hwang
Research involving bacterial pathogens often requires enumeration of bacteria colonies. Here we present a low-cost, high-throughput colony counting system consisting of colony counting software and a consumer-grade digital camera or document scanner. We

NIST Time and Frequency Bulletin

January 5, 2010
Author(s)
Eyvon Petty
The Time and Frequency Bulletin provides information on performance of time scales and a variety of broadcasts (and related information) to users of the NIST services)

Nanoscale Measurements With the TSOM Optical Method

January 4, 2010
Author(s)
Ravikiran Attota
A novel through-focus scanning optical microscope (TSOM - pronounced as 'tee-som') technique that produces nanometer dimensional measurement sensitivity using a conventional optical microscope by analyzing images obtained at different focus positions will

SRM NIST Standard Reference Materials Catalog, January 2010

January 4, 2010
Author(s)
Regina R. Montgomery, Joan C. Sauerwein
NIST Standard Reference Materials (SRMs) are used by industry, government, and academia to ensure the highest quality measurements. This catalog lists over 1100 individual reference materials produced and sold by NIST, each with carefully assigned values

3-D Metallization by Damascene Electrodeposition

January 1, 2010
Author(s)
Thomas P. Moffat, Chang H. Lee, Daniel Josell
Electrodeposition is a key fabrication process used in the state-of-the-art multilevel Cu metallization of microelectronic interconnects from transistor to circuit board length scale. Recent electrochemical surface science and feature filling studies have
Displaying 27326 - 27350 of 73830
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