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Displaying 25201 - 25225 of 73697

Developing a Diffusive Reference Material for VOC Emissions Testing: Pilot Interlaboratory Study

February 25, 2011
Author(s)
Cynthia H. Reed, Zhe Liu, Jennifer Benning, Steven Cox, Daniel V. Samarov, Dennis D. Leber, Al Hodgson, Stephany Mason, Doyun Won, John C. Little
In order to improve the reliability of product emissions testing and labeling, the National Institute of Standards and Technology (NIST) and Virginia Tech (VT) have created a program to develop reference materials with independently known emission rates

Effect of interactions on edge property measurements in magnetic multilayers

February 25, 2011
Author(s)
Meng Zhu, Robert D. McMichael
This paper reports effects of inter-film interactions on static and dynamic magnetization behavior at film edges in magnetic trilayer stripe arrays under transverse applied fields. The trilayers consist of two magnetic films of Ni80Fe20, 10 nm and 20 nm

Guide to Using Vulnerability Naming Schemes

February 25, 2011
Author(s)
David A. Waltermire, Karen Scarfone
This publication provides recommendations for using two vulnerability naming schemes: Common Vulnerabilities and Exposures (CVE) and Common Configuration Enumeration (CCE). Draft SP 800-51 Revision 1 gives an introduction to both naming schemes and makes

National Checklist Program for IT Products Guidelines for Checklist Users and Developers

February 25, 2011
Author(s)
Stephen D. Quinn, Murugiah P. Souppaya, Melanie Cook, Karen Scarfone
Special Publication 800-70 Revision 2 - National Checklist Program for IT Products Guidelines for Checklist Users and Developers describes security configuration checklists and their benefits, and it explains how to use the NIST National Checklist Program

Nitrogen Contamination in Elastic Neutron Scattering

February 23, 2011
Author(s)
Song Xue Chi, Jeffrey W. Lynn, Ying Chen, William D. Ratcliff, Benjamin Ueland, Nicholas P. Butch, Shanta R. Saha, Kevin Kirshenbaum, Johnpierre Paglione
Nitrogen gas accidentally sealed in a sample container produces various spurious effects in elastic neutron scattering measurements. These effects are systematically investigated and the details of the spurious scattering are presented.

Status Report on the Second Round of the SHA-3 Cryptographic Hash Algorithm Competition

February 23, 2011
Author(s)
Meltem Sonmez Turan, Ray A. Perlner, Lawrence E. Bassham, William E. Burr, Dong H. Chang, Shu-jen H. Chang, Morris J. Dworkin, John M. Kelsey, Souradyuti Paul, Rene C. Peralta
The National Institute of Standards and Technology (NIST) opened a public competition on November 2, 2007 to develop a new cryptographic hash algorithm - SHA-3, which will augment the hash algorithms currently specified in the Federal Information

Art in Science

February 22, 2011
Author(s)
Michael Gaitan, Laurie E. Locascio

Characterization of Hyperspectral Imaging and Analysis via Microarray Printing of Dyes

February 22, 2011
Author(s)
Matthew L. Clarke, Maritoni A. Litorja, David W. Allen, Daniel V. Samarov, Jeeseong Hwang
The application of hyperspectral imaging requires rigorous characterization of the spatial and spectral imaging domains of the system. We present a microarray printing methodology for the testing of absorption or reflectance microscopy measurements. This

Flexure-induced structural and electronic changes in polymer supported membranes of length purified single-wall carbon nanotubes

February 22, 2011
Author(s)
John M. Harris, Ganjigunte R. Iyer, Daneesh O. Simien, Jeffrey Fagan, JiYeon Huh, Jun Y. Chung, Steven Hudson, Jan Obrzut, Jack F. Douglas, Christopher Stafford, Erik K. Hobbie
Thin membranes of length purified single-wall carbon nanotubes (SWCNTs) are uniaxially compressed by depositing them on prestretched polymer substrates. Upon release of the strain, the topography, microstructure and conductivity of the films are

Security Considerations for Remote Electronic UOCAVA Voting

February 21, 2011
Author(s)
Nelson Hastings, Rene Peralta, Stefan Popoveniuc, Andrew Regenscheid
This whitepaper for the Technical Guidelines Development Committee (TGDC) identifies desirable security properties of remote electronic voting systems, potential benefits and threats to these systems, and current and emerging technical approaches for

Fe xvii X-ray Line Ratios for Accurate Astrophysical Plasma Diagnostics

February 20, 2011
Author(s)
John D. Gillaspy, E. H. Silver, L. Tedesco, Joseph N. Tan, Joshua M. Pomeroy, J M. Laming, G.-X. Chen, T. Lin
New laboratory measurements of the Ne-like Fe xvii x-ray lines in the 15-17 Angstrom range are presented, along with new theoretical predictions. These results establish consistency between independent laboratories and opens the door to trustworthy

Rate Constants for the Reactions between OH and Perfluorinated Alkenes

February 20, 2011
Author(s)
Vladimir L. Orkin, Gregory A. Poskrebyshev, Michael J. Kurylo III
The rate constants for the reactions of OH radicals with fully fluorinated alkenes containing different number of –CF3 groups next to olefinic carbon, CF2=CF2, CF2=CFCF3, CF3CF=CFCF3, (CF3)2C=CFC2F5 were measured using the flash photolysis resonance

New Research in Nanotechnology - Nanotechnology Science and Technology Series

February 19, 2011
Author(s)
Michael T. Postek, Joseph J. Kopanski, David A. Wollman
NIST is developing a broad range of nanometrology (measurements) and nanomanufacturing techniques necessary for the successful commercialization of nanotechnology. This book is a compilation of a number of selected NIST accomplishments in nanotechnology

Characterization of Approach Air Distribution for a Finned-Tube Heat Exchanger

February 18, 2011
Author(s)
David A. Yashar, Piotr A. Domanski, Hong H. Cho
The distribution of air flow approaching a finned-tube heat exchanger is one of the predominant factors influencing the heat exchanger’s performance. This paper describes a method for measuring and predicting the inlet air flow distribution using Particle

SRM Spotlight

February 18, 2011
Author(s)
Regina R. Montgomery
The SRM Spotlight is a newsletter published by the Measurement Services Division for users of NIST standard reference materials. The Spotlight announces new reference materials and provides information about their use. In addition, this newsletter contains
Displaying 25201 - 25225 of 73697
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