Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 16176 - 16200 of 17290

Scatter corrections in x-ray computed tomography: a physics-based analysis

May 22, 2019
Author(s)
Zachary H. Levine, Timothy Blattner, Adele Peskin, Adam L. Pintar
Fundamental limits for the calculation of scattering corrections within X-ray computed tomography (CT) are found within the independent atom approximation from an analysis of the cross sections, CT geometry, and the Nyquist sampling theorem, suggesting

Chemistry from 3D-printed objects

April 26, 2019
Author(s)
Matthew R. Hartings, Zeeshan Ahmed
3D printing technology has started to take hold as an enabling tool for scientific advancement. Born from the marriage of computer-aided design and additive manufacturing, 3D printing was originally intended to generate prototypes for inspection before

Improved Calculation Method for Insulation-based Fire Resistance of Composite Slabs

March 2, 2019
Author(s)
Jian Jiang, Adam L. Pintar, Jonathan M. Weigand, Joseph A. Main, Fahim Sadek
A calculation method for estimating the fire resistance of composite slabs with profiled steel decking according to the thermal insulation criterion is provided in Annex D of Eurocode 4 (EC4). In this study, comparisons between validated high-fidelity

Energy efficient single flux quantum based neuromorphic computing

November 8, 2018
Author(s)
Michael Schneider, Christine A. Donnelly, Stephen E. Russek, Burm Baek, Matthew Pufall, Pete Hopkins, William Rippard
Many neuromorphic hardware technologies are being explored for their potential to increase the efficiency of computing certain problems, and thus facilitate machine learning with greater energy efficiency and or with more complexity. Among the technologies

Fundamentals and characterizations of scratch resistance on automotive clearcoats

September 11, 2018
Author(s)
Li Piin Sung, Linqian Feng, Nadia Benhamida, Pierre Morel, Andrew T. Detwiler, Jon M. Skelly, Leslie T. Baker, Deepanjan Bhattacharya
As original equipment manufacturers (OEMs) strive to deliver improved coating performance with a sustainable footprint, opportunities for innovation are emerging, particularly on improving mechanical properties, appearance, and solids content. Resistance

Application of Link Adaptation in Body Area Networks

February 15, 2018
Author(s)
Kamran Sayrafian, Martina Barbi, Mehdi Alasti
A Body Area Network (BAN) is a wireless protocol for connectivity of wearable and implantable sensors located inside, on the surface or near the human body. Medical applications requirements impose stringent constraints on the reliability, and quality of

Thermal Exposure Sensor for Fire Fighters - full-Scale Performance Experiments

July 26, 2016
Author(s)
Nelson P. Bryner, Atul Deshmukh, John Casali, Jeff Lancaster, Roy A. McLane
During structural fire fighting suppression operations, fire fighters wear protective gear to insulate them from the high temperature environment including hot combustion gases, burning surfaces, and thermal radiation. Current turnout gear insulates the

The 2015 TWSTFT calibration for UTC and related time links

April 4, 2016
Author(s)
Zhiheng Jiang, Dirk Piester, Christian Schlunegger, Erik Dierks, Javier Galindo, Demetrios Matsakis, Victor S. Zhang
Two-Way Satellite Time and Frequency Transfer (TWSTFT or TW) is one of the primary time transfer techniques for UTC generation. Although it has expensive financial requirements it provides highly accurate calibration, and provides both robustness and

Tip characterization method using multi-feature characterizer for CD-AFM

December 23, 2015
Author(s)
Ndubuisi Orji, Hiroshi Itoh, Chumei Wang, Ronald G. Dixson, Sebastian Schmidt, Bernd Irmer, Peter S. Walecki
In atomic force microscopy (AFM) metrology, the tip is a key source of uncertainty. Images taken with an AFM show a change in feature width and shape that depends on tip geometry. This geometric distortion is more pronounced when measuring features with
Displaying 16176 - 16200 of 17290
Was this page helpful?