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NIST Authors in Bold

Displaying 10526 - 10550 of 17272

Extensions to the recommended practices for GD&T in STEP-AP210 in the context of packaged electronic components

December 4, 2009
Author(s)
Jamie Stori, Kevin G. Brady, Thomas Thurman
… of the 2nd Edition of AP-210. The largest family of standards for packaged electronic components are those published by JEDEC. The JEDEC standards are freely and publicly available, and contain … of many of the common tolerances encountered in the JEDEC standards. The GD&T standard referenced by both JEDEC and the …

Traceable Micro-Force Sensor for Instrumented Indentation Calibration

April 10, 2007
Author(s)
Douglas T. Smith, Gordon A. Shaw, R M. Seugling, D Xiang, Jon R. Pratt
… from several manufacturers. In addition, documentary standards are now becoming available from both the International Standards Organization (ISO 14577) and ASTM International … data that can be used in product specifications. These standards also define the required level of accuracy of the …

Ground Truth and Benchmarks for Performance Evaluation

April 25, 2003
Author(s)
A Takeuchi, Michael O. Shneier, Tsai H. Hong, Christopher J. Scrapper Jr, Geraldine Cheok
… of autonomous driving systems. At National Institute of Standards and Technology (NIST), we have prototyped a High …

Workshop on Micromechanics Measurement Technologies for Fiber-Polymer Interfaces

May 1, 1997
Author(s)
Walter G. McDonough, Richard~undefined~undefined~undefined~undefined~undefined Parnas, Gale A. Holmes, Donald L. Hunston
The Polymers Division hosted the Workshop on Micromechanics Measurement Technologies for Fiber-Polymer Interfaces, jointly sponsored by NIST and the Textile Research Institute of Princeton, NJ, on May 28-30, 1997. Fifty researchers from industry, academia

The NIST EXPRESS Server: Usage and Implementation

January 1, 1994
Author(s)
Don E. Libes
… The National Institute of Standards and Technology (NIST) has built numerous software … publicly available. The server maintains many STEP-related standards and draft standards for public access. Machine-processable standards …

NIST Databases on Atomic Spectra

December 1, 2001
Author(s)
Daniel E. Kelleher, William C. Martin, Wolfgang L. Wiese, Jeffrey R. Fuhr, Arlene Musgrove, Karen J. Olsen, Peter J. Mohr, Joseph Reader, Jean E. Sansonetti, Larissa Podobedova
… of the contents and features of the National Institute of Standards and TEchnology (NIST) Atomic Spectra Database (ASD) …

Terahertz On-wafer mTRL Calibration Kits For Microelectronics Characterization

October 7, 2024
Author(s)
Jerome Cheron, Robert Jones, Bryan Bosworth, Jeffrey Jargon, Benjamin Jamroz, Ari Feldman
… calibration kit is designed with thin-film microstrip standards that are optimized for the characterization of … grounded coplanar waveguide (G-CPW) transmission line standards to provide accurate characterization of …

Improved Cryptanalysis of HFEv- via Projection

April 1, 2018
Author(s)
Jintai Ding, Ray Perlner, Albrecht R. Petzoldt, Daniel Smith-Tone
The HFEv- signature scheme is one of the most studied multivariate schemes and one of the major candidates for the upcoming standardization of post-quantum digital signature schemes. In this paper, we propose three new attack strategies against HFEv-, each
Displaying 10526 - 10550 of 17272
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