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Displaying 3276 - 3300 of 4199
Tony L. Schmitz, Matthew A. Davies, Michael Kennedy
As interest in high-speed machining techniques grows among world manufacturers, efficient methods for obtaining the tool point frequency response (used as input to analytic or numerical chatter prediction/avoidance models) become more important. We
The National Institute of Standards and Technology (NIST) sponsored the Requirements Group for Real-time Extensions to the Java Platform. The Requirements Group includes representatives from companies and organizations whose expertise spans the computing
A significant portion of National Security and Emergency Preparedness (NS/EP) telecommunications relies on the Public Switched Network (PSN). Therefore, NS/EP telecommunications is concerned with the protection of the PSN to ensure that telecommunications
The National Institute of Standards and Technology (NIST), under the sponsorship of NOAA, has undertaken an appraisal of the potential risks associated with the storage of data on the 3480 type media. This study discusses the findings of the appraisal and
A study was conducted on climatological data for eleven cities located throughout the United States. Findings from this environmental study were used to develop conditioning cycles for a research project on the influence of environments on the fire
Wendel Wohlleben, Nathan Bossa, Denise Mitrano, Keana C. K. Scott
… extent in their life cycle, and releases can occur during manufacturing, use and end-of-life. Releases (what is … issues such as tire wear, advanced materials and advanced manufacturing, biodegradable polymers, and non-solid …
Sebastian Engmann, Hyun W. Ro, Andrew A. Herzing, Dean M. DeLongchamp, Chad R. Snyder, Lee J. Richter, Adam J. Barito, David J. Gundlach
… development of processes compatible with high speed manufacturing. Extensive studies of the lab-to-fab challenge … PCE in thick films is critical to solution based scale manufacturing. Extensive device analysis via impedance …
Dean G. Jarrett, Marlin E. Kraft, Isabel Castro, Brett Degler, Mark Evans
The Metrology of the Ohm Project in the Quantum Electrical Metrology Division (QEMD) at the National Institute of Standards and Technology (NIST) routinely disseminates the U. S. representation of the ohm through our calibration services and measurement