Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1851 - 1875 of 7108

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Vick V Mabel
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, George E Clark, James S Albus, Anthony J Barbera, Bradford M Smith, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beat Marron
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Vick V Mabel
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1977
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1976
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1976
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1976
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Standards for computer aided manufacturing:

January 1, 1976
Author(s)
John M Evans, Joseph T O'Neill, John L Little, James S Albus, Anthony J Barbera, Dennis W Fife, Elizabeth N Fong, David E Gilsinn, Frances E Holberton, Brian G Lucas, Gordon E Lyon, Beatrice A S Marron, Albercht J Neumann, Mabel V Vick
… Standards for computer aided manufacturing: …

Message Authentication Code (MAC) Validation System: Requirements and Procedures

May 1, 1988
Author(s)
Miles E. Smid, Elaine B. Barker, David Balenson, Martha E. Haykin
The National Bureau of Standards Message Authentication Code (MAC) Validation System (MVS) tests message authentication devices for conformance to two data authentication standards: Federal Information Processing Standard Publication (FIPS PUB) 113,

A Comparison of Predicted to Measured Photovoltaic Module Performance

June 27, 2007
Author(s)
Arthur H. Fanney, Brian P. Dougherty, Mark W. Davis
Computer simulation models to accurately predict the electrical performance of photovoltaic modules are essential. Without such models, potential purchasers of photovoltaic systems have insufficient information to judge the relative merits and cost

Comparison of Predicted to Measured Module Performance.

June 27, 2007
Author(s)
Arthur H. Fanney, Brian P. Dougherty, Mark W. Davis
Computer simulation models to accurately predict the electrical performance of photovoltaic modules are essential. Without such models, potential purchasers of photovoltaic systems have insufficient information to judge the relative merits and cost
Displaying 1851 - 1875 of 7108
Was this page helpful?