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Displaying 651 - 675 of 2769

Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers

April 1, 1989
Author(s)
John G. Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues
… thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and Cs+ primary ion beams. Bombardment with both Ar+ and O2+ produced positive secondary ion depth profiles in which pronounced distortions were … Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge …

Phase-coherent sensing of the center-of-mass motion of trapped-ion crystals

November 9, 2020
Author(s)
Matthew Affolter, Kevin Gilmore, Elena Jordan, John Bollinger
… Measurements of the center-of-mass motion of a trapped-ion crystal that are phase- coherent with an external force … the trap motional frequency on a two-dimensional trapped ion crystal of approximately 100 ions, and determine the … of weak force and electric field detection below 10−3yN/ion and 1 nV/m, respectively. …

Spectroscopy of a single Al + ion via coupling to Be +

July 25, 2005
Author(s)
Till P. Rosenband, Piet Schmidt, Jeroen Koelemeij, Wayne M. Itano, Yohei Kobayashi, Tara M. Fortier, Scott A. Diddams, James C. Bergquist, David J. Wineland
… precision spectroscopy on 27 Al + with the aid of a 9 Be + ion. Using sympathetic cooling and quantum state transfer, we … Spectroscopy of a single Al + ion via coupling to Be + …

Exponentially correlated Hylleraas-Configuration Interaction studies of atomic systems. II. Non-relativistic energies of the 1 singlet S through 6 singlet S states of the Li+ ion

October 15, 2021
Author(s)
Maria B. Ruiz, James S. Sims, Bholanath Padhy
… examine not only the ground 1 singlet S state of the Li+ ion, but the 2 singlet S through 6 singlet S excited states … Lithium ion, non-relativistic energy, singlet S states, Hy-CI, E-Hy-CI … of the 1 singlet S through 6 singlet S states of the Li+ ion

Minimization of ion micromotion in a Paul trap

January 1, 1998
Author(s)
D J. Berkeland, J D. Miller, James C. Bergquist, Wayne M. Itano, David J. Wineland
… micromotion. The first relies on the change of the average ion position as the trap potentials are changed. The second … Minimization of ion micromotion in a Paul trap …

Degradation of Poly (Acrylates Under SF 5 + Primary Ion Bombardment Studied Using Time of Flight Secondary Ion Mass Spectrometry 1. Effect of Main Chain and Pendant Methyl Groups

October 16, 2008
Author(s)
M S. Wagner
… to the depth profiling of organic materials by secondary ion mass spectrometry (SIMS). Polyatomic primary ions offer … of the polymer on its degradation under polyatomic primary ion bombardment has not yet been systematically studied. In this study, positive and negative ion time-of-flight SIMS (ToF-SIMS) was used to measure the …

Experimental demonstration of robust, high-fidelity geometric two ion-qubit phase gate

January 1, 2003
Author(s)
Dietrich G. Leibfried, B. L. DeMarco, V Meyer, D Lucas, Murray D. Barrett, Joseph W. Britton, Wayne M. Itano, Branislav M. Jelenkovic, Christopher Langer, Till P. Rosenband, David J. Wineland
… a universal geometric pi-phase gate between two beryllium ion-qubits, based on coherent displacements induced by an … force can be considered constant over the extent of each ion's wave packet. By combining the gate with single-qubit … experiment demonstrating a universal gate between two ion-qubits. The particular properties of the gate make it …

Degradation of Poly(Acrylates) Under SF 5 ^+^ Primary Ion Bombardment Studied Using Time of Flight Secondary Ion Mass Spectrometry3. Poly (Hydroxyethyl Methacrylate) With Chemical Derivazation

October 16, 2008
Author(s)
M S. Wagner
… Molecular depth profiling of polymers by secondary ion mass spectrometry (SIMS) has focused on the use of … chemistry on polymer degradation under polyatomic primary ion bombardment. In this study, time-of-flight SIMS … group chemistry on their degradation. The sputter rate and ion-induced damage accumulation rate of PHEMA were similar to …

Quantum Computing with Very Noisy Devices

February 13, 2007
Author(s)
Emanuel H. Knill
… This lecture was presented at the Workshop on Trapped Ion Quantum Computing hosted by NIST, February 21 - 24, 2006. … Workshop on Trapped Ion Quantum Computing hosted by NIST …

Patterning of Self-assembled Alkanethiol Monolayers on Silver by Microfocus Ion and Electron Beam Bombardment

April 1, 1994
Author(s)
John G. Gillen, Scott A. Wight, Joe Bennett, Michael J. Tarlov
… have been irradiated in selected areas by focused ion or electron bombardment. Subsequent immersion of the … attachment of this molecule to the silver surface in the ion or electron-exposed regions, producing a micrometer … areas was found to reach maximum levels of 70% at ion doses of 6×1013 ions/cm2 and 50% at electron doses of …

Passively Q-switched Nd-doped waveguide laser

November 15, 1994
Author(s)
J. A. Aust, K. J. Malone, D. L. Veasey, Norman Sanford, Alexana Roshko
… operating at 1.054 υm has been demonstrated in a Nd-doped phosphate glass. The channel waveguide was fabricated by K-ion exchange from a nitrate melt. Passively Q-switched pulses …

The Proteomics Standards Initiative standardized formats for spectral libraries and fragment ion peak annotations: mzSpecLib and mzPAF

August 5, 2024
Author(s)
Joshua Klein, Henry Lam, Tytus Mak, Wout Bittremieux, Yasset Perez-Riverol, Ralf Gabriels, Jim Shofstahl, Helge Hecht, Pierre-Alain Binz, Shin Kawano, Tim Van Den Bossche, Jeremy Carver, Ben Neely, Luis Mendoza, Tomi Suomi, Tine Claeys, Thomas Payne, Douwe Schulte, Zhi Sun, Nils Hoffmann, Yunping Zhu, Steffen Neumann, Andrew Jones, Nuno Bandeira, Juan Antonio Vizcaino, Eric Deutsch
… a standardized data model and serialization for fragment ion peak annotations, called mzPAF … spectral archives, file formats, data standards, fragment ion annotations … standardized formats for spectral libraries and fragment ion peak annotations: mzSpecLib and mzPAF …

Quantitative Depth Profiling of an Alternating Pt/Co Multilayer and a Pt-Co Alloy Multilayer by SIMS Using a Buckministerfullerene (C 60 )

January 1, 2007
Author(s)
K J. Kim, David S. Simons, J Greg Gillen
… A Buckminsterfullerene ion beam has been applied to the depth profiling of an … Quantitative depth profiling was performed by secondary ion mass spectrometry (SIMS) with C60 ions using Pt-Co alloy … due to the nonlinear relationship between the Co and Pt ion intensities and their compositions. …

Hyperbranched Poly(ethylene oxide) Electrolytes for Lithium Ion Batteries

May 17, 2011
Author(s)
Christopher L. Soles, Kirt A. Page, Huagen H. Peng
… PEO polymers to act as a polyelectrolyte for Li-ion batteries. Hyperbranching has been shown to lead to a 100 fold increase in the ion conductivity below the melting temperature of the PEO … Hyperbranched Poly(ethylene oxide) Electrolytes for Lithium Ion Batteries …

Quadruply-ionized barium as a candidate for a high-accuracy optical clock

October 23, 2020
Author(s)
Kyle Beloy, Vladimir A. Dzuba, Samuel Brewer
… calculations to determine relevant properties of this ion. The lifetime of the excited clock state is found to be … accommodating low statistical uncertainty with a single ion for practical averaging times. The differential static … atomic clock, highly-charged ion, ion clock, optical clock, optical frequency standard …

Influence of Ion Solvation on the Properties of Electrolyte Solutions

April 3, 2018
Author(s)
Marat Andreev, Juan J. DePablo, Alexandros Chremos, Jack F. Douglas
… and surface tension. Based on our model, we find that ion-specific effects on thermodynamics properties and by … of electrolyte solutions, derive primarily from the ion-solvation. … Influence of Ion Solvation on the Properties of Electrolyte Solutions …
Displaying 651 - 675 of 2769
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