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Displaying 1201 - 1225 of 3841

Energy Broadening of Neutron Depth Profiles by Thin Polyamide Films

September 7, 2022
Author(s)
Jamie Weaver, Anna Job, Kedar Manandhar, Ichiro Takeuchi, Robert Gregory Downing
… (NDP) measurements of sensitive materials (e.g., Li-ion batteries). Addition of this layer can increase NDP … Neutron Depth Profiling, Li-ion batteries, thin-films …

Hyperfine Coherence in the Presence of Spontaneous Photon Scattering

July 15, 2005
Author(s)
R Ozeri, C. Langer, John D. Jost, B. L. DeMarco, A. Ben-Kish, Brad R. Blakestad, Joseph W. Britton, J Chiaverini, Wayne M. Itano, David Hume, Dietrich G. Leibfried, Till P. Rosenband, Piet Schmidt, David J. Wineland
… of hyperfine-state superpositions of a trapped 9 Be + ion is experimentally studied in the presence of off-resonant …

Observation of a fault tolerance threshold with concatenated codes

December 9, 2025
Author(s)
Grace Sommers, Michael Foss-Feig, David Hayes, David Huse, Michael Gullans
… noise. We implement our state preparation protocol on ion-trap hardware with added noise to demonstrate the … quantum computing, quantum error correction, ion traps …

Temperature-Controlled Depth Profiling in Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of Sputter-Induced Topography, Chemical Damage and Depolymerization Effects

February 1, 2007
Author(s)
Christine M. Mahoney, Albert J. Fahey, John G. Gillen, Chang Xu, James Batteas
… Secondary Ion Mass Spectrometry (SIMS) employing an SF polyatomic primary ion source was used to depth profile Poly(methyl … rates, damage cross sections, and overall secondary ion stability) were monitored as a function of temperature. … Poly (methylmethacrylate) (PMMA) Using Cluster Secondary Ion Mass Spectrometry (SIMS) II. An Investigation of …

Relaxation timescales and decay of correlations in a long-range interacting quantum simulator

August 1, 2013
Author(s)
John J. Bollinger, Mauritz van den Worm, Rytis Paskauskas, Brian C. Sawyer, Michael Kastner
… also for the interpretation of data from cold atom or ion experiments. Here we study the time evolution of … these results for benchmarking a recently developed ion-trap based quantum simulator. … ion trap, Ising model, long-range interactions, quantum …

Ferroelectricity in Polar Polymer-based FETs: A Hysteresis Analysis

January 15, 2018
Author(s)
Vasileia Georgiou, Dmitry Veksler, Jason Campbell, Jason Ryan, Pragya Shrestha, D. E. Ioannou, Kin P. Cheung
There is an increasing number of reports on polar polymer-based Ferroelectric Field Effect Transistors (FeFETs), where the hysteresis of the drain current - gate voltage (Id-Vg) curve is investigated as the result of the ferroelectric polarization effect
Displaying 1201 - 1225 of 3841
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