Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 976 - 1000 of 2957

Dental Ceramic Innovations

October 16, 2008
Author(s)
J R. Kelly
… thin (0.5 mm to 0.75 mm) castings of palladium-, gold-, or nickel-based alloys. Metal substructures proved crucial to …

Experiment at NIST towards one-electron ions in circular Rydberg states

June 20, 2011
Author(s)
Joseph N. Tan, Samuel M. Brewer, Nicholas D. Guise
An experimental effort is underway at NIST to enable tests of theory with oneelectron ions synthesized in circular Rydberg states from captured bare nuclei. Problematic effects which limit the accuracy of predicted energy levels for low-lying states are

Uncertainty Improvements of the NIST Electronic Kilogram

Author(s)
Richard L. Steiner, Edwin R. Williams, Ruimin Liu, David B. Newell
This paper summarizes the latest uncertainty improvements in the NIST Electronic Kilogram experiment to obtain result of 7 +/- 37 nW/W for the ratio {W 90/W -1} (and the Planck constant), comparable to the NIST 2005 value but with a lower uncertainty. Of

Comparing the Transient Response of a Resistive-Type Sensor With a Thin Film Thermocouple During the Post-Exposure Bake Process

April 1, 2004
Author(s)
Kenneth G. Kreider, D P. DeWitt, J B. Fowler, J E. Proctor, William A. Kimes, Dean C. Ripple, Benjamin K. Tsai
Recent studies on dynamic temperature profiling and lithographic performance modeling of the post-exposure bake (PEB) process have demonstrated that the rate of heating and cooling may have an important influence on resist lithographic response. Generally

Accurate Gouy phase measurement in an astigmatic optical cavity

September 14, 2012
Author(s)
John R. Lawall, Mathieu Durand, Yicheng Wang
We present measurements of the Gouy phase accumulation for the fundamental mode of an astigmatic Fabry-Perot cavity over 70 % of its stability range. The method is based on simultaneous measurement of the resonant frequencies of the fundamental mode and

Infrared Spectra of CICN + , CINC + , and BrCN + Trapped in Solid Neon

June 27, 2007
Author(s)
Marilyn E. Jacox, Warren E. Thompson
… corresponding cation, ClCN+ or BrCN+. The NC-stretching fundamentals of the isocyanides trapped in solid neon lie … of ClCN+ to ClNC+ occurs. The two stretching vibrational fundamentals and several infrared and near infrared …

Location-specific Microstructure Characterization Within IN625 Additive Manufacturing Benchmark Test Artifacts

March 3, 2020
Author(s)
Mark R. Stoudt, Maureen E. Williams, Lyle E. Levine, Adam Abel Creuziger, Sandra A. Young, Jarred C. Heigel, Brandon Lane, Thien Q. Phan
Additive manufacturing (AM) of metals creates segregated microstructures with significant differences from those of traditional wrought alloys. Understanding how the local build conditions generate specific microstructures is essential for developing post

MODELING THE BURNING OF COMPLICATED OBJECTS USING LAGRANGIAN PARTICLES

July 4, 2010
Author(s)
Kevin B. McGrattan, Randall J. McDermott, William E. Mell, Glenn P. Forney, Jason E. Floyd, Simo A. Hostikka
A methodology is described for representing complicated objects within a computational fluid dynamics model. These objects are typically collections of similar items that are too small to define on the numerical grid that is used to solve the governing

Programmable Vector Point-Spread Function Engineering

April 1, 2006
Author(s)
M R. Beversluis, L Novotny, Stephan J. Stranick
We use a nematic liquid crystal spatial light modulator (SLM) to control the vector point spread function of a microscope objective by manipulating the pupil field polarization. In combination with an achromatic quarter-wave plate, the SLM acts as a

Overwhelming thermomechanical motion with microwave radiation pressure shot noise

August 21, 2015
Author(s)
John D. Teufel, Florent Q. Lecocq, Raymond W. Simmonds
We measure the fundamental noise processes associated with a continuous linear position measurement of a micromechanical membrane incorporated in a microwave cavity optomechanical circuit. We observe the trade-o ff between the two fundamental sources of

Report on High Energy Arcing Fault Experiments - Experimental Results from Open Box Enclosures

December 29, 2021
Author(s)
Gabriel Taylor, Anthony D. Putorti Jr., Scott Bareham, Christopher U. Brown, Wai Cheong Tam, Edward Hnetkovsky, Andre Thompson, Michael Selepak, Philip Deardorff, Kenneth Hamburger, Nicholas Melly, Kenneth Miller, Kenneth Armijo, Paul Clem, Alvaro Cruz-Cabrera, Byron Demosthenous, Austin Glover, Chris LaFleur, Raymond Martinez, James Taylor, Rana Weaver, Caroline Winters
This report documents an experimental program to investigate High Energy Arcing Fault (HEAF) phenomena. The experiments provide data to better characterize the arc to improve the prediction of arc energy emitted during a HEAF event. An open box allows for

Behaviour of high-strength bolts at elevated temperatures under double-shear loading

September 13, 2017
Author(s)
Mina S. Seif, Jonathan M. Weigand, Rafaela Peixoto, Luiz Vieira
During fire events, connections in steel structures may be subjected to large unanticipated deformations and loads. Those fire effects can produce failures of connections, including local buckling of the connection zone, rupture of connection plates, shear

Whisker & Hillock Formation on Sn, Sn-Cu and Sn-Pb Electrodeposits

November 11, 2005
Author(s)
William J. Boettinger, C E. Johnson, Leonid A. Bendersky, Kil-Won Moon, Maureen E. Williams, Gery R. Stafford
… Cantilever beam deflection measurements within 15 min of plating proved that all electrodeposits had in-plane … Pb particles within supersaturated Sn grains shortly after plating. Longer time changes in beam deflection (15 min to 1 …

Accuracy and Versatility of the NIST M48 Coordinate Measuring Machine

October 1, 2001
Author(s)
John R. Stoup, Theodore D. Doiron
The NIST Is continuing to develop the ability to perform accurate, traceable measurements on a wide range of artifacts using a very precise, error-mapped coordinate measuring machine (CMM). The NIST M48 CMM has promised accuracy and versatility for many
Displaying 976 - 1000 of 2957
Was this page helpful?