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NIST Authors in Bold

Displaying 1 - 25 of 749

Spatial and Temporal Data Alignment from Disparate Sources for Feature Association

April 25, 2024
Author(s)
Benjamin Standfield, Eric Holterfield, Russell Waddell, Allison Barnard Feeney
Among the chief topic areas of Industry 4.0, digital thread technology offers the opportunity for increased productivity, efficiency, and traceability throughout a product's lifecycle. While the basic concept of digital thread is easy to realize by

Certification Approaches for Weigh-In-Motion Systems in Law Enforcement Applications

March 26, 2024
Author(s)
Katrice Lippa, Jan Konijnenburg, Loren Minnich, Tanvi Pandya, James Willis
Every day, overweight and excessively heavy vehicles cause damage to roads, bridges, and other vehicle-based infrastructure. To protect this vital transportation infrastructure for the U.S., states have imposed weight limits for commercial and fleet

Uniform Laws and Regulations in the Areas of Legal Metrology and Fuel Quality

March 5, 2024
Author(s)
John McGuire, David Sefcik, Lisa Warfield, Yvonne Branden, Katrice Lippa
NIST Handbook 130 includes a compilation of model laws and regulations and related interpretations and guidelines designed to encourage uniformity in adoption and implementation of weights and measures laws and regulations. The model laws and regulations

A Common Data Dictionary and Common Data Model for Additive Manufacturing

February 16, 2024
Author(s)
Alexander Kuan, Kareem Aggour, Shengyen Li, Yan Lu, Luke Mohr, Alex Kitt, Hunter Macdonald
Additive manufacturing (AM) leverages emerging technologies and well-adopted processes to produce near-net-shape products. The advancement of AM technology requires data management tools to collect, store and share information through the product

Advancing Measurement Science for Microelectronics: CHIPS R&D Metrology Program

February 13, 2024
Author(s)
Marla L. Dowell, Hannah Brown, Gretchen Greene, Paul D. Hale, Brian Hoskins, Sarah Hughes, Bob R. Keller, R Joseph Kline, June W. Lau, Jeff Shainline
The CHIPS and Science Act of 2022 called for NIST to "carry out a microelectronics research program to enable advances and breakthroughs....that will accelerate the underlying R&D for metrology of next-generation microelectronics and ensure the

Certification of Standard Reference Material(R) 2693a Bituminous Coal (Nominal Mass Fraction 0.5 % Sulfur)

January 25, 2024
Author(s)
Thomas W. Vetter, Colleen E. Bryan Sallee, Brian Lang, Anthony F. Marlow, Jennifer Ness, Rick L. Paul, Adam L. Pintar, Bruce Scruggs, Nicholas Sharp, Maria Isabel Vega Martinez, John Sieber
Standard Reference Material (SRM) 2693a Bituminous Coal (Nominal Mass Fraction 0.5 % Sulfur) is intended for use in the evaluation of techniques employed in the determination of sulfur, mercury, chlorine, and ash in coal and materials of a similar matrix

Reference Correlations for the Density and Thermal Conductivity, and Review of the Viscosity Measurements, of Liquid Titanium, Zirconium, Hafnium, Vanadium, Niobium, Tantalum, Chromium, Molybdenum, and Tungsten

January 22, 2024
Author(s)
Eleftheria Ntonti, Sofia Sotiriadou, Marc Assael, Marcia L. Huber, Boris Wilthan, Manabu Watanabe
The available experimental data for the density, thermal conductivity, and viscosity of liquid titanium, zirconium, hafnium, vanadium, niobium, tantalum, chromium, molybdenum, and tungsten have been critically examined with the intention of establishing

Toward a Standard Data Architecture for Additive Manufacturing

January 16, 2024
Author(s)
Shengyen Li, Shaw C. Feng, Alexander Kuan, Yan Lu
To advance the additive manufacturing (AM) technologies, R&D projects may evaluate new facilities and different processes that need a scalable data architecture to accommodate the progressing knowledge. This work introduces a data pedigree to enable the

Employing Word-Embedding for Schema Matching in Standard Lifecycle Management

December 29, 2023
Author(s)
Hakju Oh, Boonserm Kulvatunyou, Albert T. Jones, Tim Finin
Today, businesses rely on numerous information systems to achieve their production goals and improve their global competitiveness. Semantically integrating those systems is essential for businesses to achieve both. To do so, businesses must rely on

An investigation into an approach for automated supply chain onboarding

November 21, 2023
Author(s)
Elena Jelisic, Nenad Ivezic, Boonserm Kulvatunyou, Perawit Charoenwut, Ana Nikolov
The COVID-19 pandemic has brought the cold chain for bio-pharmaceutical products to the spotlight. To preserve their structure and function, biopharmaceuticals such as cells, proteins and enzymes, RNA molecules, and RNA-based drugs (e.g., mRNA-based COVID

Fundamental Equation of State for Fluid Tetrahydrofuran

October 9, 2023
Author(s)
Felix Fiedler, Joel Karog, Eric W. Lemmon, Monika Thol
An empirical equation of state in terms of the Helmholtz energy for tetrahydro- furan is presented. In the validity range from the triple-point temperature up to 550 K and pressures up to 600 MPa, the equation of state enables the calculation of all

NIST's Antenna Gain and Polarization Calibration Service Reinstatement

October 9, 2023
Author(s)
Josh Gordon, Benjamin Moser
After a five-year renovation of the National Institute of Standards and Technology (NIST) Boulder, CO, antenna measurement facility, the Antenna On-Axis Gain and Polarization Measurements Service SKU63100S was reinstated with the Bureau International des

The NIST Silicon Lattice Comparator Upgrade

October 3, 2023
Author(s)
Marcus Mendenhall, James Cline, Csilla Szabo-Foster, Albert Henins
The NIST Silicon lattice comparator has ben in service in various forms since the 1970s. It is capable of measuring the difference in lattice spacing between specimens of high-quality float-zone silicon to delta-d/d approximately 6e-9. It has recently
Displaying 1 - 25 of 749