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The NIST Silicon Lattice Comparator Upgrade

Published

Author(s)

Marcus Mendenhall, James Cline, Csilla Szabo-Foster, Albert Henins

Abstract

The NIST Silicon lattice comparator has ben in service in various forms since the 1970s. It is capable of measuring the difference in lattice spacing between specimens of high-quality float-zone silicon to delta-d/d approximately 6e-9. It has recently undergone a thorough update of its control systems and mechanics. These upgrades result in the ability to collect more stable data with less settling time of the instrument, and with less operator intervention.
Citation
Review of Scientific Instruments
Volume
94
Issue
10

Keywords

xray diffraction, silicon, crystallography, lattice spacing

Citation

Mendenhall, M. , Cline, J. , Szabo-Foster, C. and Henins, A. (2023), The NIST Silicon Lattice Comparator Upgrade, Review of Scientific Instruments, [online], https://doi.org/10.1063/5.0169355, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936888 (Accessed June 17, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 3, 2023