Mendenhall, M.
, Cline, J.
, Szabo-Foster, C.
and Henins, A.
(2023),
The NIST Silicon Lattice Comparator Upgrade, Review of Scientific Instruments, [online], https://doi.org/10.1063/5.0169355, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=936888
(Accessed October 13, 2025)
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The NIST Silicon Lattice Comparator Upgrade
Published
Author(s)
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Abstract
The NIST Silicon lattice comparator has ben in service in various forms since the 1970s. It is capable of measuring the difference in lattice spacing between specimens of high-quality float-zone silicon to delta-d/d approximately 6e-9. It has recently undergone a thorough update of its control systems and mechanics. These upgrades result in the ability to collect more stable data with less settling time of the instrument, and with less operator intervention.Citation
Review of Scientific Instruments
Volume
94
Issue
10
Pub Type
Journals
Download Paper
Keywords
xray diffraction, silicon, crystallography, lattice spacing
Citation
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Created October 3, 2023