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Displaying 401 - 425 of 74128

NIST Handbook HB-150-3 2025 Edition

July 31, 2025
Author(s)
Derek Ho, Shelby Williamson, Hazel Richmond
NIST Handbook 150-3 presents the technical requirements and guidance for the accreditation of laboratories under the National Voluntary Laboratory Accreditation Program (NVLAP) Bulk Asbestos Fiber Analysis program. It is intended for information and use by

Estimating How Big: The Metric Estimation Game

July 30, 2025
Author(s)
Elizabeth Benham, Kristen Dill, Dinelka Jagoda, Maryanne Amanze, Yoon Thwel
The metric system (International System of Units, SI) is easy to use and learn. The Metric System Estimation Game is a fun, hands-on activity that helps participants become familiar with SI measurements by practicing estimation skills. During this activity

Effect of strain rate on tensile test results in hydrogen and other concerns

July 29, 2025
Author(s)
May Martin, Zachary Buck, Allen Eckhardt, Damian Lauria, Andrew Slifka, Matthew Connolly
Tensile tests of an X52 pipeline steel were conducted in air and in hydrogen gas over a range of five orders of magnitude of strain rate. Properties such as elastic modulus, yield strength and ultimate tensile strength were unaffected by hydrogen or by

Effect of Ionic Liquids on the Structure of Ionomer Inks

July 28, 2025
Author(s)
Tyler Martin, Kimber Stamm Masias
This study investigates the impact of ionic liquids (ILs) on the structure and performance of catalyst inks used in proton exchange membrane fuel cells (PEMFCs). Using contrast variation small-angle neutron scattering (CV-SANS), we elucidate the structural

Comparison of Bulk and Micro Sampling Techniques for the Elemental Analysis of SRM 610 and 612

July 25, 2025
Author(s)
Nicholas Sharp, Maria Isabel Vega Martinez, Ruthmara Corzo, Blaza Toman, Rick Paul, Savelas Rabb, Jack Prothero, Jamie Weaver
The glass Standard Reference Materials (SRM) 610 and 612 are frequently used for microanalysis by the forensic and geological communities. However, SRM 610 and 612 were designed and certified to be used as bulk-scale reference materials for the analysis of

Error mitigation thresholds in noisy random quantum circuits

July 25, 2025
Author(s)
Pradeep Niroula, Sarang Gopalakrishnan, Michael Gullans
Extracting useful information from noisy near-term quantum simulations requires error mitigation strategies. A broad class of these strategies rely on precise characterization of the noise source. We study the performance of such strategies when the noise

Large Area Real-Space Crystallography and Thickness Determination of Mesoscopic Semiconductor Membranes Using Zone Axis Patterns, Cold Field-Emission SEM/STEM, and Analytical S/TEM

July 25, 2025
Author(s)
Vladimir Oleshko, Glenn Holland, Daron Westly, John Villarrubia
Structural and dimensional characterization of layered structures in semiconductors is increasingly important for microelectronics manufacturing because of the continuing downward scaling of devices. Manufacturers require high-precision non-destructive

Priming Additively Manufactured Cobalt-free Maraging Steels for Improved Properties via Changes to As-Built Microstructure

July 23, 2025
Author(s)
Alec Saville, Jake Benzing, Fan Zhang, Joseph Aroh, Jordan Weaver, Russell Evans, Nicholas Derimow, Samantha Webster, Nikolas Hrabe, Cassidy Allen, Newell Moser, May Martin, Jason Holm, Christin Aumayr, Tilman Seifert, Michael Hirtler
Supply chain challenges and health concerns have spurred the development of new Co-free, Cr-containing maraging steels with several new alloys already commercialized. These alloys are a less expensive and more sustainable form of the currently used Co

The JARVIS Infrastructure is All You Need for Materials Design

July 23, 2025
Author(s)
Kamal Choudhary
The Joint Automated Repository for Various Integrated Simulations (JARVIS) is a unified platform for multiscale, multimodal, forward, and inverse materials design. It integrates diverse theoretical and experimental approaches, including density functional

ReRAM/CMOS Array Integration and Characterization via Design of Experiments

July 21, 2025
Author(s)
Imtiaz Hossen, William Borders, Advait Madhavan, Shweta Joshi, Patrick Braganca, Jabez McClelland, Brian Hoskins, Gina Adam
No two fabricated ReRAM devices are alike. This experimental reality is evident when large device arrays have to be characterized and optimized for system-level performance. Each device can have their individual optimal set of operating parameters that

Tuning Incommensurate Charge Order in Ba1-xSrxAl4 and Ba1-yEuyAl4

July 20, 2025
Author(s)
Prathum Saraf, Eleanor M. Clements, Danila Sokratov, Shanta Saha, Peter Zavalij, Thomas Heitmann, Jeffrey Lynn, Camille Bernal-Chobin, Dipanjan Chaudhuri, Caitlin Kengle, Yue Su, Simon Bettler, Nathan Manning, Peter Abbamonte, Sananda Biswas, Roser Valenti, Johnpierre Paglione
The BaAl4-type structure family is home to a vast landscape of interesting and exotic properties, with descendant crystal structures hosting a variety of electronic ground states including magnetic, superconducting and strongly correlated electron

A Large-Scale Study of Relevance Assessments with Large Language Models: An Initial Look

July 18, 2025
Author(s)
Shivani Upadhyay, Ronak Pradeep, Nandan Thakur, Daniel Campos, Nick Craswell, Ian Soboroff, Hoa Dang, Jimmy Lin
The application of large language models to provide relevance assessments presents exciting opportunities to advance IR, NLP, and beyond, but to date many unknowns remain. In this paper, we report on the results of a large-scale evaluation (the TREC 2024

2025 NIST GenAI (Pilot): Code Challenge Evaluation Plan

July 16, 2025
Author(s)
Peter Fontana, Yooyoung Lee, Hariharan Iyer, Sonika Sharma
We are launching a pilot for measuring and evaluating unit tests generated by Artificial Intelligence (AI) for testing elementary python code. This pilot will provide an environment that will facilitate the development and improvement of the abilities of

Cryogenic On-chip In Situ S-parameter Calibration using Superconducting Coplanar Waveguides

July 16, 2025
Author(s)
Jeremy Thomas, Johannes Hoffmann, Nathan Flowers-Jacobs, Anna Fox, Nicholas Jungwirth, Raegan Johnson, Paul Dresselhaus, Samuel Benz
This article presents a new multiimpedance-state line (MISL) in situ scattering parameter (S-parameter) calibration technique using on-chip superconducting transmission lines at 4 K that enables cryogenic calibration in a fixed signal path without the need
Displaying 401 - 425 of 74128
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