U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 21801 - 21825 of 73929

Correlation for the Viscosity of Hydrogen obtained from Symbolic Regression

March 27, 2013
Author(s)
Chris D. Muzny, Marcia L. Huber, Andrei F. Kazakov
We report the results of a symbolic regression methodology to obtain both the functional form and the coefficients for a wide-ranging correlation for the viscosity of normal hydrogen. The correlation covers the temperature range from the triple point

Evaluation of Pacific White Shrimp (Litopenaeus vannamei) Health During a Superintensive Aquaculture Growout using NMR-based Metabolomics

March 27, 2013
Author(s)
Tracey B. Schock, Dan Bearden, Jessica Duke, Abby Goodson, Daryl Weldon, Jeff Brunson, John Leffler
Success of the shrimp aquaculture industry requires technological advances that increase production and environmental sustainability. Indoor, superintensive, aquaculture systems have been developed that permit year-round production of farmed shrimp at high

Graphene as Transparent Electrode for Direct Observation of Hole Photoemission from Silicon to Oxide

March 27, 2013
Author(s)
Rusen Yan, Qin Zhang, Oleg A. Kirillov, Wei Li, James I. Basham, Alexander G. Boosalis, Xuelei X. Liang, Debdeep Jena, Curt A. Richter, Alan C. Seabaugh, David J. Gundlach, Huili G. Xing, Nhan V. Nguyen
The outstanding electrical and optical properties of graphene make it an excellent alternative as a transparent electrode. Here we demonstrate the application of graphene as collector material in internal photoemission (IPE) spectroscopy; enabling the

Interfacial Reaction of Co-Fe Films with SiO_{2} Substrates

March 27, 2013
Author(s)
Leonid A. Bendersky, N. V. Kazantseva, Ursula R. Kattner, M K. Kang, Vladimir P. Oleshko, Dwight Hunter, Ichiro Takeuchi
The interdiffusion reaction between Co(1-x)Fex deposited films of various compositions (x = 0.27, 0.32 and 0.50) and an amorphous SiO2 substrate during annealing in vacuum at 800o C was identified by analytical transmission electron microscopy. The

The MEMS 5-in-1 Test Chips (Reference Materials 8096 and 8097)

March 27, 2013
Author(s)
Janet M. Cassard, Jon C. Geist, Craig D. McGray, Richard A. Allen, Muhammad Y. Afridi, Brian J. Nablo, Michael Gaitan, David G. Seiler
This paper presents an overview of the Microelectromechanical Systems (MEMS) 5-in-1 Reference Material (RM), which is a single test chip with test structures from which material and dimensional properties are obtained using five documentary standard test

Analyzing Surfactant Structures on Length and Chirality Resolved (6,5) Single-Wall Carbon Nanotubes by Analytical Ultracentrifugation

March 26, 2013
Author(s)
Jeffrey A. Fagan, Ming Zheng, Jeffrey R. Simpson, Vinayak Rastogi, Constantine Y. Khripin, Carlos A. Silvera Batista, Angela R. Hight Walker
The structure and density of the bound interfacial surfactant layer and associated hydration shell were investigated using analytical ultracentrifugation for length and chirality purified (6,5) single-wall carbon nanotubes (SWCNTs) in three different bile

Camera Recognition

March 26, 2013
Author(s)
Michelle P. Steves, Brian C. Stanton, Mary F. Theofanos, Dana E. Chisnell, Hannah Wald
The Department of Homeland Security’s (DHS) United States Visitor and Immigrant Status Indicator Technology (US-VISIT) program is a biometrically-enhanced identification system primarily situated at border points of entry such as airports and seaports. In

Table-top ultrafast x-ray microcalorimeter spectrometry for molecular structure

March 26, 2013
Author(s)
Jens (. Uhlig, William B. Doriese, Joseph W. Fowler, Daniel S. Swetz, Carl D. Reintsema, Douglas A. Bennett, Leila R. Vale, Gene C. Hilton, Kent D. Irwin, Joel N. Ullom, Ilari Maasilta, Wilfred Fullagar, Niklas Gador, Sophie Canton, Kimmo Kinnunen, Villy Sundstrom
This work presents an x-ray absorption measurement by use of ionizing radiation generated by a femtosecond pulsed laser source. The spectrometer was a microcalorimetric array whose pixels are capable of accurately measuring energies of individual radiation

3-D Optical Metrology of Finite sub-20 nm Dense Arrays using Fourier Domain Normalization

March 25, 2013
Author(s)
Jing Qin, Hui Zhou, Bryan M. Barnes, Ronald G. Dixson, Richard M. Silver
Reduced target dimensions requiring improved resolution and sensitivity have driven the need to use and analyze the phase and scattered frequency information available when using image-based scatterometry systems. One such system is scatterfield microscopy

Charge-Based Capacitance Measurements Circuits for Interface With Atomic Force Microscope Probes

March 25, 2013
Author(s)
Joseph J. Kopanski, Muhammad Y. Afridi, Chong Jiang, Michael Lorek, Timothy Kohler, Curt A. Richter
The charge based capacitance measurement (CBCM) technique is highly sensitive to small capacitances and capable integration of onto an AFM tip, thereby reducing stray and wire capacitance to the bare minimum. The CBCM technique has previous been applied to

Spatially-Resolved Dopant Characterization with a Scanning Microwave Microscope

March 25, 2013
Author(s)
Thomas M. Wallis, Atif A. Imtiaz, Alexandra E. Curtin, Pavel Kabos, Matthew D. Brubaker, Norman A. Sanford, Kristine A. Bertness
The scanning microwave microscope (SMM) is a tool for spatially-resolved microwave characterization of nanoelectronic materials and devices. The microscope incorporates a sharp, near-field probe, which measures local changes in reflected microwave signals
Displaying 21801 - 21825 of 73929
Was this page helpful?