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Displaying 26201 - 26225 of 73970

Impossibility of a pure resistance measurement: The charge-pileup model

September 30, 2010
Author(s)
Neil M. Zimmerman, Denis Mamaluy
Recently, we have experimentally demonstrated the existence of a capacitance between conductors, in the absence of an insulator. We show that a combination of current continuity and Poisson's equation leads to a charge pileup, and thus a capacitance

MEMS Young's Modulus and Step Height Measurements with Round Robin Results

September 30, 2010
Author(s)
Janet M. Cassard, Richard A. Allen, Craig D. McGray, Jon C. Geist
This paper presents the results of a microelectromechanical systems (MEMS) Young s modulus and step height round robin experiment, completed in April 2009, which compares Young s modulus and step height measurement results at a number of laboratories. The

Methodology for Calculating Construction Industry Supply Chain Statistics

September 30, 2010
Author(s)
Douglas S. Thomas
Data from the Economic Census provides detailed statistics on the construction industry; however, the data is only gathered every five years. The Bureau of Labor Statistics provides statistics on the construction industry on an annual basis, but these

Security Architecture Design Process for Health Information Exchanges (HIEs)

September 30, 2010
Author(s)
Matthew A. Scholl, Kevin M. Stine, Kenneth Lin, Daniel Steinberg
The purpose of this publication is to provide a systematic approach to designing a technical security architecture for the exchange of health information that leverages common government and commercial practices and that demonstrates how these practices

Defect depth profiling in gate dielectrics

September 29, 2010
Author(s)
Kin P. Cheung
Defects in gate dielectric greatly impact the performance and reliability of advanced MOSFETs. The introduction of high-k/metal gate technology makes the characterization of defects much more important and urgent. There are a limited number of methods

Contactless Approaches for RF Characterization of Metallic Nanowires

September 28, 2010
Author(s)
Kichul Kim, Paul Rice, Thomas M. Wallis, SangHyun S. Lim, Dazhen Gu, Atif A. Imtiaz, Pavel Kabos, Dejan Filipovic
Two approaches for microwave characterization of nanowire (NW) conductivity are described in this paper. To remove the uncertainty associated with contacts, the NWs are either suspended above the center conductor of a coplanar waveguide (CPW) host or

Evaluation of Ultra-Wideband Technology for use in 3D Locating Systems

September 28, 2010
Author(s)
Adam P. Kopp, Kamel S. Saidi, Hiam Khoury
A high-powered (5 Watt peak power) ultra-wideband (UWB) ranging system was evaluated for use as the basis for a 3-Dimensional (3D) locating system by comparing tracking results to a ground truth system. The UWB ranging system is composed of five ranging

Multi-Frequency Approach to Vector-Network-Analyzer Scattering-Parameter Measurements

September 28, 2010
Author(s)
Arkadiusz C. Lewandowski, Dylan F. Williams, Wojciech Wiatr
We present a multi-frequency approach to vector-network-analyzer scattering-parameter measurements. This novel approach accounts for the relationships between the measurements at different frequencies, and thus breaks with the traditional paradigm to

Seeking Science and Technology

September 28, 2010
Author(s)
Stacy M. Bruss, Keith R. Martin
Although not everyone can be a sci-tech information specialist, science, technology, and medicine (STM) tends to overlap with other research agendas. This session will start with a general overview of science and technology websites. It will then focus on

A DS-CDMA Interference Cancellation Technique for Body Area Networks

September 27, 2010
Author(s)
Wen-Bin Yang, Kamran Sayrafian
A low complexity Parallel Interference Cancellation (PIC) technique that is applicable to body area networks is presented. Using Direct-Sequence Code Division Multiple Access (DS-CDMA), the technique aims at suppressing interference caused by rapid changes
Displaying 26201 - 26225 of 73970
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