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Mathematics & Statistics

Modeling & simulation research

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Displaying 401 - 425 of 907

Receptor heterogeneity in optical biosensors

July 13, 2017
Author(s)
David A. Edwards, Ryan Evans
Many biochemical reactions in nature involve a stream of chemical reactants (ligand molecules) flowing over a surface to which other reactants (receptors) are confined. Scientists measure rate constants associated with these reactions in an optical

Sampling Architectures for Ultra-Wideband Signals

July 3, 2017
Author(s)
Howard S. Cohl, Steve Casey
Ultra-wideband (UWB) signal processing is a technology with many features that could develop into advances in communication and information technology. The technology has tremendous potential, but also presents challenges to the signal processing community

Integrating Finite Element Analysis with Systems Engineering Models

June 11, 2017
Author(s)
Jerome Szarazi, Axel Reichwein, Conrad Bock
In order to promote traceability, consistency, interoperability and better collaboration between systems engineering and Finite Element Analysis (FEA)-based simulation activities, we propose a tool-independent description of FEA models that integrates with

Indicator frameworks

April 26, 2017
Author(s)
Sokwoo Rhee, Christine Kendrick, Abhishek Dubey, Joshua Tan
We develop a diagrammatic tool for constructing correlations between random variables, called an abstract indicator framework. Abstract indicator frameworks are modeled off operational (key performance) indicator frameworks as they are used in city

Assessing the wavelength extensibility of optical patterned defect inspection

March 29, 2017
Author(s)
Bryan Barnes, Hui Zhou, Mark-Alexander Henn, Martin Sohn, Richard M. Silver
Qualitative comparisons have been made in the literature between the scattering off deep- subwavelength-sized defects and the scattering off spheres in free space to illustrate the challenges of optical defect inspection with decreasing patterning sizes

Evaluating the Effects of Modeling Errors for Isolated Finite3-D Targets

March 29, 2017
Author(s)
Mark-Alexander Henn, Bryan Barnes, Hui Zhou
Optical 3-D nanostructure metrology utilizes a model-based metrology approach to determine critical dimensions (CDs) that are well below the inspection wavelength. Our project at the National Institute of Standards and Technology is evaluating how to

A Fast Summation Method for Oscillatory Lattice Sums

March 6, 2017
Author(s)
Ryan Denlinger, Leslie Greengard, Zydrunas Gimbutas, Vladimir Rokhlin
We present a fast summation method for lattice sums of the type which arise when solving wave scattering problems with periodic boundary conditions. While there are a variety of effective algorithms in the literature for such calculations, the approach
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