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Electronics

Sensors

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Displaying 226 - 250 of 706

Surface Micromachining for Transition-Edge Detectors

June 1, 2003
Author(s)
Gene C. Hilton, James A. Beall, Steven Deiker, Joern Beyer, Leila R. Vale, Joel Ullom, Kent D. Irwin
We are developing arrays of high performance detectors based on superconducting transition-edge sensors (TES) for application in x-ray materials analysis as well as x-ray and sub-mm astronomy. In order to obtain the desired thermal time constants, as well

T c Suppression in Superconducting Films for use in Transition Edge Sensors

June 1, 2003
Author(s)
Steven Deiker, Gene C. Hilton, Kent D. Irwin, William Rippard, Steve Ruggiero, Leila R. Vale, B. A. Young
Transition edge sensor (TES) microcalorimeters have proved their value as photon detectors in several wavelength regimes. The central elecement of a TES is a superconducting film with a transition temperature designed to be at a specific temperature

Time-Division SQUID Multiplexers for Transition-Edge Sensors

January 14, 2003
Author(s)
Kent D. Irwin, James A. Beall, Joern Beyer, Steven Deiker, W.Bertrand (Randy) Doriese, S. L. Ferreira, Gene C. Hilton, Sae Woo Nam, Carl D. Reintsema, Joel Ullom, Leila R. Vale
Microcalorimeters and bolometers based on superconducting transition-edge sensors (TES) are important tools for the detection of photons from millimeter waves through gamma rays, and for applications ranging from materials analysis to astronomy. There is a

A Well Dressed Microscope: Practical Experience with Microcalorimeter and Silicon Drift Detector Systems

December 31, 2002
Author(s)
John A. Small, Dale Newbury, John Henry J. Scott, L. King, Sae Woo Nam, Kent D. Irwin, Steven Deiker, Shaul Barkan, Jan Iwanczyk
NIST, Gaithersburg has recently installed a first generation silicon drift detector (SDD) from Photon Imaging and the NIST Boulder microcalorimeter energy dispersive x-ray spectrometer (υcal-EDS) on a JEOL 840 SEM, as shown in Fig. 1. [1,2] The instrument

The Development of Microcalorimeter EDS Arrays

November 1, 2002
Author(s)
Kent D. Irwin, James A. Beall, Steven Deiker, Gene C. Hilton, L. King, Sae Woo Nam, Dale Newbury, Carl D. Reintsema, John A. Small, Leila R. Vale
High-energy-resolution cryogenic microcalorimeters are a powerful new tool for x-ray microanalysis. With demonstrated energy resolution 20 times better than with conventional semiconductor EDS, microcalorimeters are useful in applications such as nanoscale

Advances in Weld Hydrogen Sensors

June 1, 2002
Author(s)
David Olson, B. Mishra, R D. Smith, S. Niyomsoan, P. Termsuksawad, Y D. Park, V I. Kaydanov, Z Gavra, Ronald B. Goldfarb
Through the application of modern physics concepts, advanced hydrogen sensors are being developed for rapid determination of weld hydrogen content and distribution. Electronic, optical, and magnetic property measurements have demonstrated the ability to

Present Results and Future Goals of the Cryogenic Dark Matter Search

January 1, 2002
Author(s)
T. A. Perera, D. Abrams, D. S. Akerib, D. B. Bauer, A. Bolozdynya, P. Brink, R. Bunker, B. Cabrera, D. O. Caldwell, J. P. Castle, Fengbo Hang, R. M. Clarke, M. B. Crisler, R. Dixon, D. Driscoll, S. Eichblatt, R. J. Gaitskell, S. R. Golwala, E. E. Haller, J. Hellmig, D. Holmgren, Martin Huber, S. Kamat, C. Maloney, V. Mandic, John M. Martinis, P. Meunier, Sae Woo Nam, Harold E. Nelson, M. Perillo-Issac, R. R. Ross, T. Saab, B. Sadoulet, J. Sander, R. W. Schnee, T. Shutt, Amy Smith, A. H. Sonnenschein, A. L. Spadafora, G. Wang
The Cryogenic Dark Matter Search (CDMS) uses Ge and Si detectors to search for Weakly Interacting Massive Particles (WIMPs) via their elastic-scattering interaction with atomic nuclei. The present results from CDMS give limits on the spin-independent WIMP

Microhotplate Platforms for Chemical Sensor Research

June 1, 2001
Author(s)
Stephen Semancik, Richard E. Cavicchi, M C. Wheeler, J E. Tiffany, G Poirier, R M. Walton, John S. Suehle, B. Panchapakesan, D. E. DeVoe
This paper describes the development and use of microdevices and microarrays in chemical sensor research. The surface-micromachined microhotplate structure common within the various platforms included here was originally designed for fabricating

Jim Zimmerman and the SQUID

March 1, 2001
Author(s)
Richard L. Kautz
The career of Jim Zimmerman, beginning with a solid foundation in electronics and cryogenics, reached a turning point in 1965 when he became coinventor of the rf SQUID (Superconducting Quantum Interference Device), while working at the Scientific

First Steps Towards Small Arrays of Mo/Au Microcalorimeters

December 1, 2000
Author(s)
J. Olsen, E. C. Kirk, K. Thomsen, B. van den Brandt, Ph. Lerch, L. Scandella, A. Zehnder, S. Mango, H. R. Ott, Martin Huber, Gene C. Hilton, John M. Martinis
We are developing small arrays of microcalorimeters based on transition edge sensors made with Mo/Au bilayers deposited on silicon nitride membranes and Au absorbers. The superconducting transition of the bilayers is adjusted to be around 130 mK with a

Microcalorimeter Energy Dispersive X-ray Spectrometer for Low Voltage Microanalysis

November 1, 2000
Author(s)
David A. Wollman, John M. Martinis, Sae Woo Nam, Gene C. Hilton, Kent D. Irwin, David A. Rudman, Norman F. Bergren, Steven Deiker, Martin Huber, Dale Newbury
Improved x-ray detector technology continues to be a critical metrological need in the semiconductor industry for contaminant particle analysis 1,2 and for high-spatial-resolution x-ray microanalysis using low-beam-voltage field-emission scanning electron

SQUIDs Past, Present, and Future: A Sympsium in Honor of Jim Zimmerman

October 1, 2000
Author(s)
Richard L. Kautz
The symposium on SQUIDs Past, Present, and Future was held at the National Institute of Standards and Technology in Boulder, Colorado on November 15, 1997 to celebrate the career of James E. Zimmerman. As a member of a team at the Ford Scientific

Comparison of Elemental Detection Using Microcalorimetry, SIMS, AES and EDS (SEM, STEM, and TEM)

August 1, 2000
Author(s)
C. B. Vartuli, F. A. Stevie, David A. Wollman, M. Antonell, R. B. Irwin, J. M. McKinley, T L. Shofner, B. M. Purcell, S. A. Anderson, Bobby To
Cu contamination has become a larger concern as more semiconductor fabrication facilities switch from aluminum to Cu interconnects. The resolution limits of several analytical tools are compared to determine the optimum analysis methods for detecting Cu
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