Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Scanning Electron Microscopy with Polarization Analysis Studies of Ni-Fe Magnetic Memory Elements

Published

Author(s)

John Unguris, M Scheinfein, Robert Celotta, Daniel T. Pierce

Abstract

This paper describes the use of Scanning Electron Microscopy with Polarization Analysis to quantitatively image the magnetic structure of permalloy magnetic memory elements. Various methods of determining the absolute magnitude and direction of the magnetization vector are described. The magnetic domain structures are observed as a function of ion milling time. During ion milling the surface composition is monitored by Auger analysis.
Citation
IEEE Transactions on Magnetics
Volume
25
Issue
5

Citation

Unguris, J. , Scheinfein, M. , Celotta, R. and Pierce, D. (1989), Scanning Electron Microscopy with Polarization Analysis Studies of Ni-Fe Magnetic Memory Elements, IEEE Transactions on Magnetics (Accessed April 12, 2024)
Created December 31, 1988, Updated October 12, 2021