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RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges

Published

Author(s)

James R. Baker-Jarvis

Abstract

This paper is an overview on the RF materials characterization metrology at NBS/NIST. Over the years, measurements on the electrical permittivity and permeability as functions of frequency and temperature have been crucial for a wide array of applications. Characterization of these parameters has been instrumental in development of electromagnetic shielding materials, wireless communications circuitry, medical applications, and microelectronics.
Conference Dates
October 14-17, 2001
Conference Location
KITCHENER, CA
Conference Title
Conf. Electrical Insulation Dielectric Meas.

Keywords

dielectric, magnetic, measurements, packaging materials, permeability, permittivity, resonators, substrates

Citation

Baker-Jarvis, J. (2001), RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges, Conf. Electrical Insulation Dielectric Meas., KITCHENER, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29176 (Accessed June 18, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created October 14, 2001, Updated January 27, 2020