Baker-Jarvis, J.
(2001),
RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges, Conf. Electrical Insulation Dielectric Meas., KITCHENER, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29176
(Accessed May 9, 2025)
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RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges
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Abstract
This paper is an overview on the RF materials characterization metrology at NBS/NIST. Over the years, measurements on the electrical permittivity and permeability as functions of frequency and temperature have been crucial for a wide array of applications. Characterization of these parameters has been instrumental in development of electromagnetic shielding materials, wireless communications circuitry, medical applications, and microelectronics.Conference Dates
October 14-17, 2001
Conference Location
KITCHENER, CA
Conference Title
Conf. Electrical Insulation Dielectric Meas.
Pub Type
Conferences
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Keywords
dielectric, magnetic, measurements, packaging materials, permeability, permittivity, resonators, substrates
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created October 14, 2001, Updated January 27, 2020