RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges
James R. Baker-Jarvis
This paper is an overview on the RF materials characterization metrology at NBS/NIST. Over the years, measurements on the electrical permittivity and permeability as functions of frequency and temperature have been crucial for a wide array of applications. Characterization of these parameters has been instrumental in development of electromagnetic shielding materials, wireless communications circuitry, medical applications, and microelectronics.
RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges, Conf. Electrical Insulation Dielectric Meas., KITCHENER, CA, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29176
(Accessed December 3, 2023)