TY  - CONF
AU  - James Baker-Jarvis
C2  - Conf. Electrical Insulation Dielectric Meas., KITCHENER, CA
DA  - 2001-10-14
LA  - en
PB  - Conf. Electrical Insulation Dielectric Meas., KITCHENER, CA
PY  - 2001
TI  - RF Materials Characterization Metrology at NBS/NIST: Past and Recent Work, Future Directions and Challenges
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=29176
ER  -