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Resistance in transition-edge sensors: A comparison of the resistively shunted junction and two-fluid models

Published

Author(s)

Douglas A. Bennett, Daniel S. Swetz, Daniel R. Schmidt, Joel N. Ullom

Abstract

The transition between the superconducting and normal states is of extreme practical importance because the very sharp onset of resistance in voltage biased thin films is the basis for transition- edge sensors (TESs). TESs are being successfully utilized in many new instruments despite the fact that there is no consensus model that describes the resistance as a function of both temperature and current R(T,I). A new model assuming a TES can be described as a resistively shunted junction (RSJ) has generated much interest. Here we compare the predictions of this model with the predictions of a two-fluid model and measured data. Except for some small TESs (characteristic size
Citation
Physical Review Letters
Volume
87
Issue
2

Keywords

superconductivity, transition-edge sensors

Citation

Bennett, D. , Swetz, D. , Schmidt, D. and Ullom, J. (2013), Resistance in transition-edge sensors: A comparison of the resistively shunted junction and two-fluid models, Physical Review Letters, [online], https://doi.org/10.1103/PhysRevB.87.020508 (Accessed February 25, 2024)
Created January 25, 2013, Updated November 10, 2018