Creuziger, A.
and Vaudin, M.
(2011),
Report on VAMAS Round Robin of ISO 13067: Microbeam Analysis—Electron Backscatter Diffraction—Measurement of Average Grain Size, NIST Interagency/Internal Report (NISTIR), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.IR.7814
(Accessed October 16, 2025)
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Report on VAMAS Round Robin of ISO 13067: Microbeam AnalysisElectron Backscatter DiffractionMeasurement of Average Grain Size
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,
Abstract
The authors recently participated in a round robin evaluation of a new ISO document draft, ISO 13067: Microbeam analysis Electron backscatter diffraction Measurement of average grain size. This report details the results of the study, some of the difficulties encountered and suggestions to improve the ISO document. The average grain size measured using this technique was reasonable as compared internally within this study and compared well to the aggregate round robin data revealed to us. The methods described in ISO 13067 to modify or clean up the raw data were found to significantly affect the average grain size value.Citation
NIST Interagency/Internal Report (NISTIR) - 7814
Report Number
7814
NIST Pub Series
Pub Type
NIST Pubs
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Created September 14, 2011, Updated November 10, 2018