Scaling electronic devices to nano-scale dimensions may introduce unforeseen physical mechanisms that may seriously compromise device reliability. It has been discussed that as individual atoms comprise a larger fraction of the actual device area, defects associated with atomic-level changes may dominate failure and drift mechanisms. Also, it is expected that failure distributions will become more dispersed as the activation energy for defect generation is not expressed as a single value but as a distribution of values.
Proceedings Title: Nano and Giga Challenges in Electronics and Photonics
Conference Dates: March 14-16, 2007
Conference Location: Phoenix, AZ
Pub Type: Conferences
Failure Mechanisms, Nanoelectronics, Reliability